Abstract: Most contacts that are used in electrical switchgear are prone to erosion due to electrical arcs that are developed at the make and break of a circuit. Arcing is one of the major problems that can cause catastrophic failure of switchgear. In accordance with the invention, a discreet, controlled semiconductor switching assembly is provided within the conventional contact structure to reduce arcing. The semiconductor switching assembly includes a voltage-controlled gate that permits current flow through the contact only when desired. Current is allowed to flow only when the contact gap has been completely closed and is prevented from flowing immediately before the contacts are opened. Thus, there is very little current available to form an arc plasma, and, therefore, erosion of the contact surface is minimal, being mostly the product of mechanical wear.