Patents by Inventor Eric R. Reid

Eric R. Reid has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Rating apparatus and method for evaluating bugs
    Patent number: 6978441
    Abstract: A method of rating a bug, including reporting the bug to a business entity by an interested party, entering information regarding the bug into a database, assigning a priority number for the bug, calculating a sigma number for the bug using the priority number, evaluating the bug to be fixed using the sigma number, and escalating the bug. A bug council rating apparatus, including a database to store the information entered using a graphical user interface, a priority number module configured to generate a priority number, and a sigma number module configured to generate a sigma number.
    Type: Grant
    Filed: October 3, 2001
    Date of Patent: December 20, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Christopher A. Atwood, Yousef R. Yacoub, Eric R. Reid, James C. Liu, Angelo Rajadurai, Prashant Srinivasan, Mehdi Ghazizadeh
  • Rating apparatus and method for evaluating bugs
    Publication number: 20030066049
    Abstract: A method of rating a bug, including reporting the bug to a business entity by an interested party, entering information regarding the bug into a database, assigning a priority number for the bug, calculating a sigma number for the bug using the priority number, evaluating the bug to be fixed using the sigma number, and escalating the bug. A bug council rating apparatus, including a database to store the information entered using a graphical user interface, a priority number module configured to generate a priority number, and a sigma number module configured to generate a sigma number.
    Type: Application
    Filed: October 3, 2001
    Publication date: April 3, 2003
    Inventors: Christopher A. Atwood, Yousef R. Yacoub, Eric R. Reid, James C. Liu, Angelo Rajadurai, Prashant Srinivasan, Mehdi Ghazizadeh