Patents by Inventor Eric Yeh-Wei Tseo

Eric Yeh-Wei Tseo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10990075
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion, a geometric relationship analyzer, an inspection motion path generation portion, and a user interface including an editable plan representation of a current workpiece feature inspection plan, a workpiece inspection program simulation portion configured to display a 3D view including geometric features and inspection operation representations, and a context sensitive menu portion. The context sensitive menu portion displays a context sensitive relational command menu that indicates a valid set of relational commands including relational feature or relational measurement commands operable to define a corresponding constructed feature or corresponding relational measurement operation to be included in the current workpiece feature inspection plan.
    Type: Grant
    Filed: September 27, 2016
    Date of Patent: April 27, 2021
    Assignees: Mitutoyo Corporation, Mitutoyo Europe GmbH
    Inventors: Frank Uwe Madsen, Samuel Wu, Eric Yeh-Wei Tseo, Tobias Friedrich
  • Patent number: 10254113
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance volume creation elements. The workpiece inspection program simulation portion displays a 3D view and the auxiliary collision avoidance volume creation elements are operable to create or define auxiliary collision avoidance volumes that are displayed in the 3D view. In various implementations, rather than requiring a user to model a physical object (e.g., as part of a workpiece or CMM) in a CAD file, the user may instead create and position an auxiliary collision avoidance volume at a location where the physical object is expected to be, so as to prevent collisions that could occur with the physical object.
    Type: Grant
    Filed: May 3, 2016
    Date of Patent: April 9, 2019
    Assignees: Mitutoyo Corporation, Mitutoyo Europe GmbH
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo, Bart De Vlieghere, Michael Peter
  • Publication number: 20180194017
    Abstract: Technologies and implementations for a cutting apparatus configured to have cutting depths be controllable are generally disclosed.
    Type: Application
    Filed: January 9, 2017
    Publication date: July 12, 2018
    Inventor: Eric Yeh-Wei TSEO
  • Patent number: 9952586
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface including a workpiece inspection program simulation portion, an editing user interface portion, and a simulation status and control portion. The simulation status and control portion is configured to respond to selection of workpiece features or inspection operation representations (e.g., as selected in the workpiece inspection program simulation portion or editing user interface portion). The simulation status and control portion response to the selection includes altering a simulation status portion (e.g.
    Type: Grant
    Filed: May 1, 2015
    Date of Patent: April 24, 2018
    Assignees: Mitutoyo Corporation, Mitutoyo Europe GMBH
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo, Bart De Vlieghere
  • Publication number: 20180089360
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion, a geometric relationship analyzer, an inspection motion path generation portion, and a user interface including an editable plan representation of a current workpiece feature inspection plan, a workpiece inspection program simulation portion configured to display a 3D view including geometric features and inspection operation representations, and a context sensitive menu portion. The context sensitive menu portion displays a context sensitive relational command menu that indicates a valid set of relational commands including relational feature or relational measurement commands operable to define a corresponding constructed feature or corresponding relational measurement operation to be included in the current workpiece feature inspection plan.
    Type: Application
    Filed: September 27, 2016
    Publication date: March 29, 2018
    Inventors: Frank Uwe Madsen, Samuel Wu, Eric Yeh-Wei Tseo, Tobias Friedrich
  • Patent number: 9646425
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface comprising a 3D view, and editable plan representation. Both the 3D view and the editable plan representation are configure to be automatically responsive to operations in a first set of editing operations, regardless of whether the operations are performed in the 3D view or the editable plan representation of the user interface. The first set of editing operations may comprise deleting (or adding) at least one workpiece feature in the 3D view or the editable plan representation of the user interface, for example. Various other portions of the system (e.g. other user interface windows) may also be automatically responsive to the first set of editing operations, regardless of where the editing operations are performed in the user interface.
    Type: Grant
    Filed: May 4, 2015
    Date of Patent: May 9, 2017
    Assignees: Mitutoyo Corporation, Mitutoro Europe GMBH
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo
  • Patent number: 9639083
    Abstract: A system and method are provided for programming workpiece feature inspection operations for a coordinate measuring machine. An editing environment is operated to display a 3-dimensional workpiece representation comprising a first surface feature of a workpiece. A first feature surface sampling pattern is created having at least one pattern parameter adjusted to correspond to a first surface feature of the workpiece. A corresponding representation of the sampling pattern includes operative sampling pattern locations located proximate to the first surface feature. User operations in the GUI further adjust pattern parameters of the sampling pattern. The further adjustment of the pattern parameters simultaneously affects a plurality of the sampling pattern locations.
    Type: Grant
    Filed: December 18, 2013
    Date of Patent: May 2, 2017
    Assignee: Mitutoyo Corporation
    Inventors: Eric Yeh-Wei Tseo, Dahai Yu
  • Publication number: 20170067737
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance volume creation elements. The workpiece inspection program simulation portion displays a 3D view and the auxiliary collision avoidance volume creation elements are operable to create or define auxiliary collision avoidance volumes that are displayed in the 3D view. In various implementations, rather than requiring a user to model a physical object (e.g., as part of a workpiece or CMM) in a CAD file, the user may instead create and position an auxiliary collision avoidance volume at a location where the physical object is expected to be, so as to prevent collisions that could occur with the physical object.
    Type: Application
    Filed: May 3, 2016
    Publication date: March 9, 2017
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo, Bart De Vlieghere, Michael Peter
  • Publication number: 20160300396
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface comprising a 3D view, and editable plan representation. Both the 3D view and the editable plan representation are configure to be automatically responsive to operations in a first set of editing operations, regardless of whether the operations are performed in the 3D view or the editable plan representation of the user interface. The first set of editing operations may comprise deleting (or adding) at least one workpiece feature in the 3D view or the editable plan representation of the user interface, for example. Various other portions of the system (e.g. other user interface windows) may also be automatically responsive to the first set of editing operations, regardless of where the editing operations are performed in the user interface.
    Type: Application
    Filed: May 4, 2015
    Publication date: October 13, 2016
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo
  • Publication number: 20160299493
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface including a workpiece inspection program simulation portion, an editing user interface portion, and a simulation status and control portion. The simulation status and control portion is configured to respond to selection of workpiece features or inspection operation representations (e.g., as selected in the workpiece inspection program simulation portion or editing user interface portion). The simulation status and control portion response to the selection includes altering a simulation status portion (e.g.
    Type: Application
    Filed: May 1, 2015
    Publication date: October 13, 2016
    Inventors: Dahai Yu, Eric Yeh-Wei Tseo, Bart De Vlieghere
  • Publication number: 20150169790
    Abstract: A system and method are provided for programming workpiece feature inspection operations for a coordinate measuring machine. An editing environment is operated to display a 3-dimensional workpiece representation comprising a first surface feature of a workpiece. A first feature surface sampling pattern is created having at least one pattern parameter adjusted to correspond to a first surface feature of the workpiece. A corresponding representation of the sampling pattern includes operative sampling pattern locations located proximate to the first surface feature. User operations in the GUI further adjust pattern parameters of the sampling pattern. The further adjustment of the pattern parameters simultaneously affects a plurality of the sampling pattern locations.
    Type: Application
    Filed: December 18, 2013
    Publication date: June 18, 2015
    Applicant: Mitutoyo Corporation
    Inventors: Eric Yeh-Wei Tseo, Dahai Yu
  • Patent number: 8271895
    Abstract: A method is provided for programming step and repeat operations of a machine vision inspection system. The machine vision inspection system includes an imaging portion, a stage for holding one or more workpieces in a field of view (FOV) of the imaging portion, a control portion, and a graphical user interface (GUI). According to the method, a user operates the machine vision inspection system to define a set of inspection operations to be performed on a first configuration of workpiece features. The user also operates the GUI to display a step and repeat dialog box, in which he defines a first plurality of parameters defining a set of default step and repeat locations for performing the defined set of inspection operations. The user further operates the GUI to define a set of inspection step and repeat locations, which is a subset of the defined set of default step and repeat locations, where the inspection operations are to be actually performed.
    Type: Grant
    Filed: March 22, 2010
    Date of Patent: September 18, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Eric Yeh-Wei Tseo, Dahai Yu, Ryan Northrup
  • Publication number: 20110231787
    Abstract: A method is provided for programming step and repeat operations of a machine vision inspection system. The machine vision inspection system includes an imaging portion, a stage for holding one or more workpieces in a field of view (FOV) of the imaging portion, a control portion, and a graphical user interface (GUI). According to the method, a user operates the machine vision inspection system to define a set of inspection operations to be performed on a first configuration of workpiece features. The user also operates the GUI to display a step and repeat dialog box, in which he defines a first plurality of parameters defining a set of default step and repeat locations for performing the defined set of inspection operations. The user further operates the GUI to define a set of inspection step and repeat locations, which is a subset of the defined set of default step and repeat locations, where the inspection operations are to be actually performed.
    Type: Application
    Filed: March 22, 2010
    Publication date: September 22, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Eric Yeh-Wei Tseo, Dahai Yu, Ryan Northrup