Patents by Inventor Erich R. Gross

Erich R. Gross has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6836325
    Abstract: The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.
    Type: Grant
    Filed: August 17, 2001
    Date of Patent: December 28, 2004
    Assignee: Textron Systems Corporation
    Inventors: Anthony K. Maczura, Erich R. Gross, Anthony S. Lee, David M. Mayes
  • Patent number: 6424416
    Abstract: Percentage concentrations of constituents or color components of a sample are determined using a spectral analyzer with a wide illumination spot size and detector. The analyzer irradiates the sample, picks up diffuse reflectance of individual wavelengths from the sample and spatially separates the diffuse reflectance into a response at individual wavelengths. The result is to simultaneously detect the intensities of the individual wavelengths in parallel from the sample being analyzed. Percentage constituents of a composite substance can be determined or, alternatively, the components of color in a sample can be determined by analyzing wavelengths of reflected light.
    Type: Grant
    Filed: October 25, 1999
    Date of Patent: July 23, 2002
    Assignee: Textron Systems Corporation
    Inventors: Erich R. Gross, Anthony S. Lee
  • Publication number: 20010055116
    Abstract: The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.
    Type: Application
    Filed: August 17, 2001
    Publication date: December 27, 2001
    Inventors: Anthony K. Maczura, Erich R. Gross, Anthony S. Lee, David M. Mayes