Patents by Inventor Erik Frank Matlin

Erik Frank Matlin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PASSIVE OPTICAL DETECTION METHOD AND SYSTEM FOR VEHICLES
    Publication number: 20200349819
    Abstract: A system, method, and apparatus are discussed for a passive optical camera-based system to detect a presence of one or more vehicles with one or more cameras. A detection algorithm is applied to recognize of the presence of the one or more vehicles using one or more imaging processors and the one or more cameras to detect fluctuations in light intensity from scattered light and/or reflections off of that vehicle. Those scattered light and/or reflections are captured in images contained in a set of frames from the one or more cameras.
    Type: Application
    Filed: July 22, 2019
    Publication date: November 5, 2020
    Inventors: Richard Andrew Hill, Karen Marie Nashold, Zachary Flom, Erik Frank Matlin, Robert A. Brown
  • Passive optical detection method and system for vehicles
    Patent number: 10403107
    Abstract: A system, method, and apparatus are discussed for a passive optical camera-based system to detect a presence of one or more vehicles with one or more cameras. A detection algorithm is applied to recognize of the presence of the one or more vehicles using one or more imaging processors and the one or more cameras to detect fluctuations in light intensity from scattered light and/or reflections off of that vehicle. Those scattered light and/or reflections are captured in images contained in a set of frames from the one or more cameras.
    Type: Grant
    Filed: July 6, 2017
    Date of Patent: September 3, 2019
    Assignee: SRI International
    Inventors: Richard Andrew Hill, Karen Marie Nashold, Zachary Flom, Erik Frank Matlin, Robert A. Brown
  • Method and apparatus for conducting automated integrated circuit analysis
    Patent number: 10180402
    Abstract: A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.
    Type: Grant
    Filed: October 29, 2013
    Date of Patent: January 15, 2019
    Assignee: SRI International
    Inventors: David S. Stoker, Erik Frank Matlin, Motilal Agrawal, James R. Potthast, Neil William Troy
  • PASSIVE OPTICAL DETECTION METHOD AND SYSTEM FOR VEHICLES
    Publication number: 20180012461
    Abstract: A system, method, and apparatus are discussed for a passive optical camera-based system to detect a presence of one or more vehicles with one or more cameras. A detection algorithm is applied to recognize of the presence of the one or more vehicles using one or more imaging processors and the one or more cameras to detect fluctuations in light intensity from scattered light and/or reflections off of that vehicle. Those scattered light and/or reflections are captured in images contained in a set of frames from the one or more cameras.
    Type: Application
    Filed: July 6, 2017
    Publication date: January 11, 2018
    Inventors: Richard Andrew Hill, Karen Marie Nashold, Zachary Flom, Erik Frank Matlin, Robert A. Brown
  • METHOD AND APPARATUS FOR CONDUCTING AUTOMATED INTEGRATED CIRCUIT ANALYSIS
    Publication number: 20140172345
    Abstract: A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.
    Type: Application
    Filed: October 29, 2013
    Publication date: June 19, 2014
    Applicant: SRI International
    Inventors: David S. Stoker, Erik Frank Matlin, Motilal Agrawal, James R. Potthast, Neil William Troy