Patents by Inventor Eriko TOMONAGA

Eriko TOMONAGA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8574449
    Abstract: Quickly making changes to etching conditions suppresses the production yield of printed wiring boards from being deteriorated. Disclosed is a method comprising: an etching step that comprises: preparing a conductor-clad base material continuous in a certain direction, the conductor-clad base material (1) having an insulating layer and one or more conductive layers formed on main surfaces of the insulating layer; and subjecting a predetermined region of a conductor layer of one main surface of the conductor-clad base material (1) to an etching process thereby to form a wiring pattern (1a) to be of a product and an inspection pattern (1b) to be used for inspection; a measuring step that measures a line width of the inspection pattern after the etching step; and a control step that controls an etching condition in the etching step based on the measured line width.
    Type: Grant
    Filed: May 2, 2012
    Date of Patent: November 5, 2013
    Assignee: Fujikura Ltd.
    Inventors: Hirohito Watanabe, Taiji Ogawa, Eriko Tomonaga
  • Publication number: 20120279050
    Abstract: Quickly making changes to etching conditions suppresses the production yield of printed wiring boards from being deteriorated. Disclosed is a method comprising: an etching step that comprises: preparing a conductor-clad base material continuous in a certain direction, the conductor-clad base material (1) having an insulating layer and one or more conductive layers formed on main surfaces of the insulating layer; and subjecting a predetermined region of a conductor layer of one main surface of the conductor-clad base material (1) to an etching process thereby to form a wiring pattern (1a) to be of a product and an inspection pattern (1b) to be used for inspection; a measuring step that measures a line width of the inspection pattern after the etching step; and a control step that controls an etching condition in the etching step based on the measured line width.
    Type: Application
    Filed: May 2, 2012
    Publication date: November 8, 2012
    Applicant: FUJIKURA LTD.
    Inventors: Hirohito WATANABE, Taiji OGAWA, Takaomi Tomonaga, Eriko TOMONAGA