Patents by Inventor Etsuo Iizuka

Etsuo Iizuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8508110
    Abstract: An MCP has a rectangular plate shape and has a porous part, to which a plurality of pores (channels) penetrating in the thickness direction are disposed, and a poreless part including a solid glass or the like to which the channels are not provided on the both sides of the porous part. Then, on both surfaces of the MCP, an input side electrode and an output side electrode are respectively formed so as to cover the poreless parts on the both surfaces while sandwiching the porous part.
    Type: Grant
    Filed: July 14, 2010
    Date of Patent: August 13, 2013
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Toshiyuki Uchiyama, Motohiro Suyama
  • Patent number: 8357892
    Abstract: A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.
    Type: Grant
    Filed: March 24, 2010
    Date of Patent: January 22, 2013
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Motohiro Suyama, Etsuo Iizuka, Akio Suzuki, Hiroshi Kobayashi
  • Patent number: 8294089
    Abstract: In a charged particle detecting apparatus 100 for which an MCP is sandwiched with an IN electrode 1 and an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrode 1 are arranged further inside than the IN electrode 1 when viewed from an MCP incident surface, and the charged particle detecting apparatus 100 is fixed by screwing and the like to a cabinet wall surface 330 of a TOF-MS by using a flange portion provided at a part of IN electrode 1 projected further outside than the rear component members.
    Type: Grant
    Filed: March 19, 2009
    Date of Patent: October 23, 2012
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama
  • Patent number: 8022606
    Abstract: An electron multiplier that can easily obtain characteristics according to a purpose is provided. By bonding a marginal portion 23 of an MCP 2 and a marginal portion 33 of an MCP 3 to each other via a conductive spacer layer 7, a gap 12 is formed between channel portions 22, 32. Therefore, when the electron multiplier is used for a purpose that requires a particularly high gain, by adjusting the thickness of the spacer layer 7, the gain can be increased by increasing the gap 12. In addition, when the electron multiplier is used for a purpose that requires an increase in gain as well as time characteristics, by adjusting the thickness of the spacer layer 7, the size of the gap 12 can be adjusted so that desired characteristics are obtained. Consequently, by only adjusting the thickness of the spacer layer 7, characteristics according to the purpose can be easily obtained.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: September 20, 2011
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Akihiro Kageyama, Motohiro Suyama
  • Patent number: 7982172
    Abstract: In an MCP assembly 10 having one or a plurality of MCPs 5, 6 sandwiched with an input-side electrode 4 and an output-side electrode 7, there provided at the surface facing the MCP 5, 6 of at least either (preferably, both) of the input-side electrode 4 and the output-side electrode 7, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.
    Type: Grant
    Filed: March 5, 2009
    Date of Patent: July 19, 2011
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama
  • Publication number: 20110018419
    Abstract: An MCP has a rectangular plate shape and has a porous part, to which a plurality of pores (channels) penetrating in the thickness direction are disposed, and a poreless part including a solid glass or the like to which the channels are not provided on the both sides of the porous part. Then, on both surfaces of the MCP, an input side electrode and an output side electrode are respectively formed so as to cover the poreless parts on the both surfaces while sandwiching the porous part.
    Type: Application
    Filed: July 14, 2010
    Publication date: January 27, 2011
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo Iizuka, Toshiyuki Uchiyama, Motohiro Suyama
  • Publication number: 20100243887
    Abstract: A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.
    Type: Application
    Filed: March 24, 2010
    Publication date: September 30, 2010
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Motohiro SUYAMA, Etsuo Iizuka, Akio Suzuki, Hiroshi Kobayashi
  • Publication number: 20100225221
    Abstract: An electron multiplier that can easily obtain characteristics according to a purpose is provided. By bonding a marginal portion 23 of an MCP 2 and a marginal portion 33 of an MCP 3 to each other via a conductive spacer layer 7, a gap 12 is formed between channel portions 22, 32. Therefore, when the electron multiplier is used for a purpose that requires a particularly high gain, by adjusting the thickness of the spacer layer 7, the gain can be increased by increasing the gap 12. In addition, when the electron multiplier is used for a purpose that requires an increase in gain as well as time characteristics, by adjusting the thickness of the spacer layer 7, the size of the gap 12 can be adjusted so that desired characteristics are obtained. Consequently, by only adjusting the thickness of the spacer layer 7, characteristics according to the purpose can be easily obtained.
    Type: Application
    Filed: March 2, 2010
    Publication date: September 9, 2010
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo Iizuka, Akihiro Kageyama, Motohiro Suyama
  • Publication number: 20090236517
    Abstract: In a charged particle detecting apparatus 100 for which an MCP is sandwiched with an IN electrode 1 and an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrode 1 are arranged further inside than the IN electrode 1 when viewed from an MCP incident surface, and the charged particle detecting apparatus 100 is fixed by screwing and the like to a cabinet wall surface 330 of a TOF-MS by using a flange portion provided at a part of IN electrode 1 projected further outside than the rear component members.
    Type: Application
    Filed: March 19, 2009
    Publication date: September 24, 2009
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo IIZUKA, Katsutoshi NONAKA, Masahiro HAYASHI, Yuuya WASHIYAMA
  • Publication number: 20090230286
    Abstract: In an MCP assembly 10 having one or a plurality of MCPs 5, 6 sandwiched with an input-side electrode 4 and an output-side electrode 7, there provided at the surface facing the MCP 5, 6 of at least either (preferably, both) of the input-side electrode 4 and the output-side electrode 7, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.
    Type: Application
    Filed: March 5, 2009
    Publication date: September 17, 2009
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama