Abstract: A device including an optical measuring device and an optical system which can measure the light intensity of the scattered light from the sample and the spatial distribution of the scattered light and which is excellent in the sensitivity is provided. In the device, the image distortion is suppressed by providing such a structure that the light emitted from the first substance is reflected by the ellipsoidal mirror two or more even times before reaching the second substance. The image distortion is suppressed by arranging two ellipsoidal mirrors so that respective one focuses are set to a common focus while remaining other two focuses are arranged on one line so as to be opposite to each other across the common focus, setting the common focus to a blank, arranging a first substance on one of the focuses, and arranging a second substance on the other of the focuses.

Abstract: In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1.

Abstract: In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1.

Abstract: In order to measure a complex dielectric constant of a thin film on a substrate, a method includes irradiating the thin film sample with light at a first incident angle so that the light undergoes multiple internal reflections within the thin film sample. The method also includes measuring light that has transmitted through or reflected on the thin film sample following the multiple internal reflections, and determining a complex dielectric constant of the thin film sample based upon a spectrum of the transmitted or reflected light that has undergone the multiple internal reflections.

Abstract: A substrate in a parallelepiped plate form satisfies an interference condition when incident light has a wavelength (?) fallen under the following (d: thickness, n: refractive index, ?: incident angle, N: integer). 2 ? nd ? 1 - ( sin ? ? ? / n ) 2 ? = N [ Equation ? ? 7 ] At this time, the light in a transmission spectrum is intensified to cause a fringe peak to appear, whereas the light in a reflection spectrum is weakened to provide a fringe valley. At around the wavelength (frequency), as the incident angle is increased, the transmittance nears zero while reflectance increases nearing 1.

Abstract: In an optical system, first and second optical paths intersected with each other on a sample holder are set, wherein the first and second optical paths are formed so that light from a light source is projected to be converged on the intersection from an incoming side beam switching mirror that selectively switches a direction of the light via one of first and second converged light reflectors, first and second received light reflectors that projects the light to an exiting side beam switching mirror disposed on the first and second optical paths respectively, the exiting side beam switching mirror switches a direction of the light projected from one of the first and second received light reflectors, and intensity of light from the sample in case of face side incidence and back side incidence to the sample can be measured.

Abstract: An optical system for determining an optical constant by measuring the absolute reflectance and the absolute transmittance of a substance by using an incoming side beam switching mirror for selectively switching the direction of a light from a light source to first or second converged light reflecting units. The first and second converged light reflecting units project the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder that can be positioned to present a sample fitting hole or a through hole for measuring the reflectance/transmittance by providing the light to an exit side beam switching mirror and detector.

Abstract: In an optical system, first and second optical paths intersected with each other on a sample holder are set, wherein the first and second optical paths are formed so that light from a light source is projected to be converged on the intersection from an incoming side beam switching mirror that selectively switches a direction of the light via one of first and second converged light reflectors, first and second received light reflectors that projects the light to an exiting side beam switching mirror disposed on the first and second optical paths respectively, the exiting side beam switching mirror switches a direction of the light projected from one of the first and second received light reflectors, and intensity of light from the sample in case of face side incidence and back side incidence to the sample can be measured.

Abstract: There is provided an optical system for measurement of optical constant capable of measuring the absolute reflectance and the absolute transmittance for determining the optical constant of a substance with excellent accuracy without replacing the optical system during the measurement by using a different system for measuring the absolute reflectance and the absolute transmittance of the sample, comprising an incoming side beam switching mirror for selectively switching the direction of the light from a light source to a first or second converged light reflecting means side, first and second converged light reflecting means for projecting the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder, the sample bolder capable of selectively positioning a sample fitting hole or a through hole at the converging position by the converged light reflecting means by advancing/retracting the sample fitting hole or the through hole, first and second receive