Patents by Inventor Eugene D. Feit

Eugene D. Feit has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4262081
    Abstract: Radiation sensitive negative resists with requisite stability for dry processing of integrated circuits are polymerized from aromatic moieties containing halogen atoms. Halogen-aryl bridging, generally carbonaceous, increases sensitivity to radiation. Exemplary materials, copolymers prepared from aromatic and glycidyl methacrylate (GMA) comonomers, are suitable for direct processing of large-scale integrated circuits. While electron beam patterning is contemplated both for direct processing and mask making, radiation such as X-ray and deep u.v. may be used.
    Type: Grant
    Filed: November 21, 1979
    Date of Patent: April 14, 1981
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventors: Murrae J. S. Bowden, Eugene D. Feit, Larry F. Thompson, Cletus W. Wilkins, Jr.
  • Patent number: 4208211
    Abstract: Radiation sensitive negative resists with requisite stability for dry processing of integrated circuits are polymerized from aromatic moieties containing halogen atoms. Halogen-aryl bridging, generally carbonaceous, increases sensitivity to radiation. Exemplary materials, copolymers prepared from aromatic and glycidyl methacrylate (GMA) comonomers, are suitable for direct processing of large-scale integrated circuits. While electron beam patterning is contemplated both for direct processing and mask making, radiation such as X-ray and deep u.v. may be used.
    Type: Grant
    Filed: May 23, 1978
    Date of Patent: June 17, 1980
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventors: Murrae J. S. Bowden, Eugene D. Feit, Larry F. Thompson, Cletus W. Wilkins, Jr.
  • Patent number: 4201580
    Abstract: Fabrication of fine dimensioned circuits, e.g., VLSI includes at least one lithographic step dependent upon members of a particular category of polymer resists. Such resists, generally negative acting, are characterized by high contrast due to unusually narrow molecular weight distribution of the polymer molecules. This distribution is in turn dependent upon choice of a base polymer which is itself characterized by narrow molecular weight distribution due to "living polymerization" (solution anionic, polymerization). Functionalization of such base polymer is designedly such as to retain narrow distribution. Chlorinated polystyrene is exemplary of the resist category.
    Type: Grant
    Filed: July 24, 1978
    Date of Patent: May 6, 1980
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventor: Eugene D. Feit
  • Patent number: 4136225
    Abstract: A flame retardant, flexible, solder resistant covercoat has been formulated based on dichloropropyl acrylate.
    Type: Grant
    Filed: July 8, 1977
    Date of Patent: January 23, 1979
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventors: Eugene D. Feit, Marguerite E. Wurtz
  • Patent number: 4130424
    Abstract: Negative resist compositions are based on carbonaceous polymers with substituent branches containing epoxy groupings. Exemplary materials which include, for example, a copolymer of glycidyl methacrylate and ethyl acrylate in which epoxy groupings are unesterified show high sensitivity, for example, to electron radiation and to X-rays. Resolution is sufficient to permit expedient fabrication of detailed resist patterns for integrated circuits. High adherence permits use of acid or base reagents and thermal stability permits use of ion milling for circuit fabrication.
    Type: Grant
    Filed: July 1, 1977
    Date of Patent: December 19, 1978
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventors: Eugene D. Feit, Larry F. Thompson