Patents by Inventor Ewald Roessl

Ewald Roessl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170301503
    Abstract: The invention relates to a modification arrangement for an X-ray generating device, a modification method, a computer program element for controlling such device and a computer readable medium having stored such computer program element. The modification arrangement comprises a cathode, an anode (2) and modification means, e.g. a modification device. The cathode is configured to provide an electron beam (15). The anode (2) is configured to rotate under impact of the electron beam (15) and is segmented by slits (21) arranged around the anode's circumference. The modification means are configured to modify the electron beam (15) when the electron beam (15) is hitting one of the anode's rotating slits (21).
    Type: Application
    Filed: September 30, 2015
    Publication date: October 19, 2017
    Inventors: ROLF KARL OTTO BEHLING, EWALD ROESSL
  • Patent number: 9782138
    Abstract: An imaging apparatus comprising a radiation source (2) for emitting radiation from a focal region (20) through an imaging area (5), a detection unit (6) for detecting radiation from said imaging area (5), said detection unit comprising an anti-scatter grid (62) and a detector (61), a gantry (1) to which said radiation source (2) and said detection unit (6) are mounted and a controller (9) for controlling said detection unit (6) to detect radiation at a plurality of projection positions and for manipulating the position, setting and/or orientation of at least a part of said radiation source (2) and/or said detection unit (6) at first projection positions (80) so that the radiation incident on the detector (61) at said first projection positions is attenuated by said anti-scatter grid (62) to a larger extent compared to second projection positions (80) representing the remaining projection positions.
    Type: Grant
    Filed: September 22, 2015
    Date of Patent: October 10, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Thomas Koehler, Roland Proksa, Bernhard Johannes Brendel, Ewald Roessl
  • Publication number: 20170285186
    Abstract: The present invention relates to an X-ray detector comprising a directly converting semiconductor layer (60) having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source (2) or light emitted by at least one light source (30, 33).
    Type: Application
    Filed: December 9, 2015
    Publication date: October 5, 2017
    Inventors: Ewald ROESSL, Heiner DAERR
  • Publication number: 20170285187
    Abstract: The invention relates to an X-ray detector device (10) for detection of X-ray radiation at an inclined angle relative to the X-ray radiation, an X-ray imaging system (1), an X-ray imaging method, and a computer program element for controlling such device or system for performing such method and a computer readable medium having stored such computer program element. The X-ray detector device (10) comprises a cathode surface (11) and an anode surface (12). The cathode surface (11) and the anode surface (12) are displaced by a separation layer (13) allowing charge transport (T) between the cathode surface (11) and the anode surface (12) in response to X-ray radiation incident during operation on the cathode surface (11). The anode surface (12) is segmented into anode pixels (121) and the cathode surface (11) is segmented into cathode pixels (111).
    Type: Application
    Filed: December 1, 2015
    Publication date: October 5, 2017
    Inventors: EWALD ROESSL, THOMAS KOEHLER
  • Patent number: 9775572
    Abstract: An imaging system (500) includes a focal spot (510) that rotates along a path around an examination region (506) and emits radiation. A collimator (512) collimates the radiation, producing a radiation beam (516) that traverses a field of view (520) of the examination region and a subject or object therein. A detector array (522), located opposite the radiation source, across the examination region, detects radiation traversing the field of view and produces a signal indicative of the detected radiation. A beam shaper (524), located between the radiation source and the collimator, rotates in coordination with the focal spot and defines an intensity profile of the radiation beam. The beam shaper includes a plurality of elongate x-ray absorbing elements (606) arranged parallel to each other along a transverse direction with respect to a direction of the beam, separated from each other by a plurality of material free regions (604).
    Type: Grant
    Filed: November 28, 2013
    Date of Patent: October 3, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Tsvi Katchalski, Ewald Roessl, Reuven Levinson
  • Publication number: 20170258412
    Abstract: The invention relates to a system (31) for generating spectral computed tomography projection data. A spectral projection data generation device (6) comprising an energy-resolving detector generates spectral computed tomography projection databased on polychromatic radiation (4), which has been provided by a radiation device (2), after having traversed an examination zone (5), and a reference values generation device generates energy-dependent reference values based on radiation, which has not traversed the examination zone. A spectral parameter providing unit (12) provides a spectral parameter being indicative of a spectral property of the radiation device based on the energy-dependent reference values.
    Type: Application
    Filed: December 1, 2015
    Publication date: September 14, 2017
    Inventors: Heiner DAERR, Roger STEADMAN BOOKER, Gereon VOGTMEIER, Ewald ROESSL, Gerhard MARTENS, Carolina RIBBING
  • Patent number: 9761021
    Abstract: A method includes obtaining a dark-field signal generated from a dark-field CT scan of an object, wherein the dark-field CT scan is at least a 360 degree scan. The method further includes weighting the dark-field signal. The method further includes performing a cone beam reconstruction of the weighted dark-field signal over the 360 degree scan, thereby generating volumetric image data. For an axial cone-beam CT scan, in one non-limiting instance, the cone-beam reconstruction is a full scan FDK cone beam reconstruction. For a helical cone-beam CT scan, in one non-limiting instance, the dark-field signal is rebinned to wedge geometry and the cone-beam reconstruction is a full scan aperture weighted wedge reconstruction. For a helical cone-beam CT scan, in another non-limiting instance, the dark-field signal is rebinned to wedge geometry and the cone-beam reconstruction is a full scan angular weighted wedge reconstruction.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: September 12, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Thomas Koehler, Bernhard Johannes Brendel, Ewald Roessl, Udo van Stevendaal
  • Patent number: 9750471
    Abstract: A method includes determining calibration factors for calibrating photon-counting detectors of a spectral imaging system by combining a heuristic calibration of the photon-counting detectors and an analytical calibration of the photon-counting detectors and generating a set of photon-counting calibration factors based on the combining of the a heuristic calibration and the analytical calibration. The photon-counting calibration factors, when applied to measured energy-resolved data from the photon-counting detectors of a spectral CT scan of a subject or object, mitigate spectral distortion caused by a radiation intensity profile shaper that filters a radiation beam of the spectral CT scan.
    Type: Grant
    Filed: May 10, 2014
    Date of Patent: September 5, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Carsten Oliver Schirra, Axel Thran, Heiner Daerr, Ewald Roessl
  • Patent number: 9730759
    Abstract: A method includes obtaining first spectral image data, which includes at least a first component corresponding to a targeted first K-edge based contrast agent administered to a subject if a target of the targeted first K-edge based contrast agent is present in the subject, decomposing the first spectral image data into at least the first component, reconstructing the first component thereby generating a first image of the targeted first K-edge contrast agent, determining if the targeted first K-edge contrast agent is present in the first image, and generating a signal indicating the targeted first K-edge contrast agent is present in the first image in response to determining the targeted first K-edge contrast agent is present in the first image.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: August 15, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Carsten Oliver Schirra, Ewald Roessl, Roland Proksa
  • Patent number: 9717470
    Abstract: An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.
    Type: Grant
    Filed: August 20, 2013
    Date of Patent: August 1, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Gerhard Martens, Heiner Daerr, Thomas Detlef Istel, Ewald Roessl, Udo Van Stevendaal
  • Publication number: 20170202528
    Abstract: The invention relates to a grating device (1) for an X-ray imaging device, an interferometer unit (2), an X-ray imaging system, an X-ray imaging method, and a computer program element for controlling such device and a computer readable medium having stored such computer program element. The grating device (1) for an X-ray imaging device comprises a grating arrangement (10) and an actuation arrangement. The grating arrangement (10) comprises a plurality of grating segments (11). The actuation arrangement is configured to move the plurality of grating segments (11) with at least a rotational component between a first position and a second position. In the first position, the grating segments (11) are arranged in the path of an X-ray beam (30), so that the grating segments (11) influence portions of the X-ray beam (30).
    Type: Application
    Filed: July 20, 2015
    Publication date: July 20, 2017
    Inventors: Ewald ROESSL, Thomas KOEHLER, Hans-Aloys WISCHMANN
  • Publication number: 20170206682
    Abstract: A system and related method for X-ray phase contrast imaging. A signal model is fitted to interferometric measurment data. The fitting operation yields a Compton cross section and a photo-electric image. A pro-portionality between the Compton cross section and electron-density is used to achieve a reduction of the number of fitting variables. The Compton image may be taken, up to a constant, as a phase contrast images.
    Type: Application
    Filed: July 16, 2015
    Publication date: July 20, 2017
    Inventors: Ewald ROESSL, Thomas KOEHLER
  • Publication number: 20170196524
    Abstract: The present invention relates to an imaging apparatus and a corresponding imaging method.
    Type: Application
    Filed: September 22, 2015
    Publication date: July 13, 2017
    Inventors: Thomas KOEHLER, Roland PROKSA, Bernhard Johannes BRENDEL, Ewald ROESSL
  • Publication number: 20170156686
    Abstract: The invention relates to X-ray imaging. In order to improve flexibility, for example in relation with phase-contrast imaging, the X-ray imaging device (10) comprises an X-ray source arrangement for providing an X-ray beam (11). Further, it is provided at least one grating (13, 14) and a line detector (15) with a plurality of sensor lines, which sensor lines are each provided by a plurality of sensor elements, and which sensor lines are provided for detecting respective portions of the X-ray beam (11) passing the at least one grating during operation. The X-ray imaging device is arranged for moving the line detector (15) and an object (21) to be imaged relative to each other, such that in response to the portions of the X-ray beam a number of interference patterns are detectable at respective different relative positions of the line detector and the object for reconstructing an image of the object (21).
    Type: Application
    Filed: July 7, 2015
    Publication date: June 8, 2017
    Inventors: Thomas KOEHLER, Ewald ROESSL
  • Patent number: 9664797
    Abstract: The invention relates to a detector unit (100) for the detection of photons of incident radiation. The detector unit (100) comprises a signal processing circuit (40, 50, 60) for generating signals (V0) that are dependent on the energy of a currently detected photon (X) and at least one processing-parameter (Rf). Moreover, it comprises a flux estimator (70) for estimating the flux of photons and for adjusting the processing-parameter (Rf) based on said estimated flux. The flux estimator (70) receives its input (Vi), from which the flux of photons is estimated, from a processing stage that is independent of the output of the signal processing circuit. In a preferred embodiment, the signal processing circuit is or comprises a shaper (40).
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: May 30, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Ewald Roessl, Roger Steadman-Booker
  • Patent number: 9649082
    Abstract: An X-ray differential phase contrast imaging device (10) comprises an X-ray source (20) for generating an X-ray beam; a source grating (G0) for generating a coherent X-ray beam from a non-coherent X-ray source (20); a collimator (22) for splitting the coherent X-ray beam into a plurality of fan-shaped X-ray beams (28) for passing through an object (14); a phase grating (G1) for generating an interference pattern and an absorber grating (G2) for generating a Moiré pattern from the interference pattern arranged after the object (14); and a line detector (24) for detecting the Moiré pattern generated by the phase grating (G1) and the absorber grating (G2) from the fan-shaped X-ray beams (28) passing through the object (14).
    Type: Grant
    Filed: September 16, 2014
    Date of Patent: May 16, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Hans-Aloys Wischmann, Ewald Roessl
  • Publication number: 20170122885
    Abstract: A phantom body (PB) for use in a differential phase contrast imaging apparatus (IM) for calibration of same. The phantom body (PB) allows for simultaneous calibration of three different image signal channels, namely refraction, phase shift and small angle scattering.
    Type: Application
    Filed: May 18, 2015
    Publication date: May 4, 2017
    Inventors: Udo VAN STEVENDAAL, Heiner DAERR, Thomas KOEHLER, Gerhard MARTENS, Ewald ROESSL
  • Patent number: 9640293
    Abstract: The invention relates to a grating arrangement and a method for spectral filtering of an X-ray beam (B), the grating arrangement comprising: a dispersive element (10) comprising a prism configured to diffract the X-ray beam (B) into a first beam component (BC1) comprising a first direction (D1) and a second beam component comprising (BC2) a second direction (D2), tilted with respect to the first direction; a first grating (20) configured to generate a first diffraction pattern (DP1) of the first beam component (BC1) and a second diffraction pattern (DP2) of the second beam component (BC2), the second diffraction pattern (DP2) shifted with respect to the first diffraction patter (DP1); and a second grating (30) comprising at least one opening (31) which is aligned along a line (d) from a maximum (MA) to a minimum (MI) of intensity of the first diffraction pattern (DP1) or of the second diffraction pattern (DP2).
    Type: Grant
    Filed: November 12, 2014
    Date of Patent: May 2, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Ewald Roessl, Thomas Koehler
  • Patent number: 9625589
    Abstract: The invention relates to a method and an X-ray detector (100) for detecting incident X-ray photons (X). The X-ray detector (100) comprises at least one sensor unit (105) in which X-ray photons (X) are converted into sensor signals (s) and at least one flux sensor (104) for generating a flux signal (f) related to the flux of photons (X). The sensor signals (s) are corrected based on the flux signal (f). In a preferred embodiment, the sensor signals (s) represent a spectrally resolved pulse counting. The flux sensor (104) may be integrated into an ASIC (103) that is coupled to the sensor unit (105).
    Type: Grant
    Filed: July 15, 2013
    Date of Patent: April 18, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Ewald Roessl, Daerr Heiner, Roger Steadman Booker
  • Publication number: 20170100085
    Abstract: Methods and related apparatuses for processing of count events detected by an X-ray sensitive detector. A signal model is fitted to the detected events to compute a physical quantity of interest.
    Type: Application
    Filed: June 25, 2015
    Publication date: April 13, 2017
    Inventor: Ewald ROESSL