Abstract: Disclosed herein are techniques for performing memory access. In one embodiment, an integrated circuit includes a port and an access engine. The integrated circuit is coupled with a memory device. The access engine is configured to: receive, from an access requester device, a request to access data stored at a memory device; and based on receiving the request: provide, via the port, a sequential access of a plurality of portions of the data to the access requester device; and access the plurality of portions of the data in a parallel form at the memory device for the access requester device. The sequential access can include a sequential write access or a sequential read access of the plurality of portions of the data.

Abstract: Disclosed herein are techniques for performing memory access. In one embodiment, an integrated circuit may include a memory device, a first port to receive first data elements from a memory access circuit within a first time period, and a second port to transmit second data elements to the memory access circuit within a second time period. The memory access circuit may receive the first data elements from the memory device within a third time period shorter than the first time period and transmit, via the first port, the received first data elements to a first processing circuit sequentially within the first time period. The memory access circuit may receive, via the second port, the second data elements from a second processing circuit sequentially within the second time period, and store the received second data elements in the memory device within a fourth time period shorter than the second time period.

Abstract: A semiconductor device includes a system clock signal having a system clock period and a digital ring oscillator (DRO) cluster having DRO cells. Each of the DRO cells is disposed at a different location in the semiconductor device for producing a local ring oscillator clock signal. The local ring oscillator clock signal has a ring oscillator clock period that is shorter than the system clock period. The DRO cluster is configured to measure respective ring oscillator clock count in each of the DRO cells during a time window synchronized to the system clock.