Abstract: An iris scanning device includes a first camera that captures an image of a face of a user and a second camera that captures an image of an eye of the user subsequent to the image of the face being captured. The iris scanning device includes a gimbal having a mirror mounted thereon and a facial feature detector that identifies facial features of the user based upon the image of the face. The iris scanning device further includes control circuitry that adjusts an orientation of the gimbal based upon the facial features, where the image of the eye is captured upon the orientation of the gimbal being adjusted, and where the mirror mounted on the gimbal is oriented to cause the image of the eye to be captured. An iris of the eye of the user may be located in a central region of the image of the eye.

Abstract: An iris scanning device includes a first camera that captures an image of a face of a user and a second camera that captures an image of an eye of the user subsequent to the image of the face being captured. The iris scanning device includes a gimbal having a mirror mounted thereon and a facial feature detector that identifies facial features of the user based upon the image of the face. The iris scanning device further includes control circuitry that adjusts an orientation of the gimbal based upon the facial features, where the image of the eye is captured upon the orientation of the gimbal being adjusted, and where the mirror mounted on the gimbal is oriented to cause the image of the eye to be captured. An iris of the eye of the user may be located in a central region of the image of the eye.

Abstract: An apparatus for a frequency characterization of an electronic system is provided. The apparatus includes two terminals configured to couple with the electronic system. Further, the apparatus includes a control circuit configured to generate a test signal. The apparatus further includes a coupling circuit including an adjustable impedance and a switch which are coupled in series. End nodes of the coupling circuit are coupled to the two terminals. The switch is configured here to electrically couple the two terminals with each other based on the test signal.

Abstract: It is known that in particular components or component accessories are stored in a storage in industrial production. To this end, a depot storage unit for storing small parts is proposed, having a base frame, a rotary table, wherein the rotary table is rotatably supported on the base frame and is rotatable relative to the base frame and wherein the rotary table includes a base plate, a drive device, wherein the drive device is operatively connected to the rotary table, so that the drive device rotates the rotary table, a plurality of receiving boxes, wherein the receiving boxes are arranged on the base plate in the direction of rotation, wherein the depot storage unit includes at least or exactly one sensor device for detecting a weight of at least or exactly one of the receiving boxes.

Abstract: An apparatus for a frequency characterization of an electronic system is provided. The apparatus includes two terminals configured to couple with the electronic system. Further, the apparatus includes a control circuit configured to generate a test signal. The apparatus further includes a coupling circuit including an adjustable impedance and a switch which are coupled in series. End nodes of the coupling circuit are coupled to the two terminals. The switch is configured here to electrically couple the two terminals with each other based on the test signal.