Abstract: An apparatus includes a latch of a clock gating circuit (CGC). The latch is configured to generate a first signal in response to a clock signal. The apparatus further includes a delay circuit of the CGC. The delay circuit is configured to receive the clock signal and to generate a second signal based on the clock signal and the first signal. The apparatus further includes an output circuit of the CGC. The output circuit is coupled to the delay circuit and to the latch. The output circuit is configured to generate a master clock signal based on the clock signal and the second signal. An edge of the master clock signal is delayed with respect to an edge of the clock signal based on a delay characteristic associated with a slave clock signal.

Abstract: An apparatus includes a latch of a clock gating circuit (CGC). The latch is configured to generate a first signal in response to a clock signal. The apparatus further includes a delay circuit of the CGC. The delay circuit is configured to receive the clock signal and to generate a second signal based on the clock signal and the first signal. The apparatus further includes an output circuit of the CGC. The output circuit is coupled to the delay circuit and to the latch. The output circuit is configured to generate a master clock signal based on the clock signal and the second signal. An edge of the master clock signal is delayed with respect to an edge of the clock signal based on a delay characteristic associated with a slave clock signal.

Abstract: Circuits and methods for latch-tracking pulse generation across process, voltage and temperature (PVT) variations are disclosed. In one embodiment, the method includes receiving a clock input at a pulse generation circuit and generating a pulse at the pulse generation circuit in response to the clock input. The method further includes distributing the pulse to a mimic latch, which writes a mimic storage node through a mimic storage circuit of the mimic latch in response to the pulse. The method further includes terminating generation of the pulse at the pulse generation circuit in response to a transition of the mimic storage node. The method may include receiving a clock enable input at a pulse control circuit coupled to the pulse generation circuit and either suppressing or allowing generation of a pulse in response to a value of the clock enable input.

Abstract: A latch integrated circuit has synchronous data loading and self-timed asynchronous data capture characteristics. The integrated circuit may include a latch, a pulse generator and a comparator. The latch can be responsive to a data signal and a write enable signal. The pulse generator may be configured to generate the write enable signal as a pulse. This pulse may have a leading edge synchronized with a first edge of a clock signal and a self-timed trailing edge synchronized with an edge of a comparison signal. The comparator may be configured to generate the comparison signal in response to comparing logic levels of at least two nodes within the integrated circuit.

Abstract: Circuits and methods for latch-tracking pulse generation across process, voltage and temperature (PVT) variations are disclosed in one embodiment, the method includes receiving a clock input at a pulse generation circuit and generating a pulse at the pulse generation circuit in response to the clock input. The method further includes distributing the pulse to a mimic latch, which writes a mimic storage node through a mimic storage circuit of the mimic latch in response to the pulse. The method further includes terminating generation of the pulse at the pulse generation circuit in response to a transition of the mimic storage node. The method may include receiving a clock enable input at a pulse control circuit coupled to the pulse generation circuit and either suppressing or allowing generation of a pulse in response to a value of the clock enable input.

Abstract: A circuit having a local power block for leakage reduction is disclosed. The circuit has a first portion and a second portion. The first portion is configured to operate at a substantially greater operating frequency than the operating frequency of the second portion. The second portion has a local power block configured to decouple the second portion if the second portion is inactive to reduce leakage current associated with the second portion without sacrificing performance of the first portion.

Abstract: A latch integrated circuit has synchronous data loading and self-timed asynchronous data capture characteristics. The integrated circuit may include a latch, a pulse generator and a comparator. The latch can be responsive to a data signal and a write enable signal. The pulse generator may be configured to generate the write enable signal as a pulse. This pulse may have a leading edge synchronized with a first edge of a clock signal and a self-timed trailing edge synchronized with an edge of a comparison signal. The comparator may be configured to generate the comparison signal in response to comparing logic levels of at least two nodes within the integrated circuit.

Abstract: A dual-path, multimode sequential storage element (SSE) is described herein. In one example, the dual-path, multimode SSE comprises first and second sequential storage elements, a data input, a data output, and a selector mechanism. The first and second sequential storage elements each have an input and an output. The data input is coupled to the inputs of both sequential storage elements and is configured to accept data. The data output is coupled to the outputs of both sequential storage elements and is configured to output the data. The selector mechanism is configured to select one of the sequential storage elements for passing the data from the data input to the data output. In one example, the first sequential storage element comprises a pulse-triggered storage element and the second sequential storage element comprises a master-slave storage element.

Abstract: A circuit having a local power block for leakage reduction is disclosed. The circuit has a first portion and a second portion. The first portion is configured to operate at a substantially greater operating frequency than the operating frequency of the second portion. The second portion has a local power block configured to decouple the second portion if the second portion is inactive to reduce leakage current associated with the second portion without sacrificing performance of the first portion.

Abstract: A circuit having a local power block for leakage reduction is disclosed. The circuit has a first portion and a second portion. The first portion is configured to operate at a substantially greater operating frequency than the operating frequency of the second portion. The second portion has a local power block configured to decouple the second portion if the second portion is inactive to reduce leakage current associated with the second portion without sacrificing performance of the first portion.

Abstract: A multimode, uniform-latency clock generation circuit (CGC) is described herein. In one example, the multimode, uniform-latency CGC generates a pulse clock signal via a clock generation path responsive to a clock chopping signal being active and generates a phase clock signal via the same clock generation path responsive to the clock chopping signal being inactive. The clock chopping signal is activated responsive to a mode control input signal being in a first state and deactivated responsive to either the mode control input signal being in a second state or a plurality of clock enable signals being inactive. In one or more embodiments, a multimode, uniform-latency CGC is included in a microprocessor for providing pulse clock signals to inter-stage pulsed sequential storage elements when operating in a timing sensitive mode and for providing phase clock signals to the inter-stage pulsed sequential storage elements when operating in a timing insensitive mode.

Abstract: A multi-enabled clock gating circuit reduces clock enable setup time. In one example, the multi-enabled clock gating circuit comprises an OAI logic gate and a clock enable control circuit. The OAI logic gate is configured to generate a gated clock signal by inverting an input clock signal responsive to one of a timing-sensitive clock enable signal and a timing-insensitive clock enable signal being active. The clock enable control circuit is configured to prevent the OAI logic gate from receiving the timing-insensitive clock enable signal responsive to the timing-sensitive clock enable signal being active. In one or more embodiments, a multi-enabled clock gating circuit having reduced clock enable setup time may be included in an integrated circuit for implementing clock gating during different operating modes of the integrated circuit.

Abstract: A system and method for creating, editing, and/or executing a test program for testing a transformer is provided. The system includes an input that allows the user to select the desired test instructions and pre-existing sequences of test instructions to create or edit a test program having a sequence of test instructions. The processor executes the test program by generating commands that are performed in a predetermined order.

Abstract: A system and method for creating, editing, and/or executing a test program for testing a transformer is provided. The system includes an input that allows the user to select the desired test instructions and pre-existing sequences of test instructions to create or edit a test program having a sequence of test instructions. The processor executes the test program by generating commands that are performed in a predetermined order.