Patents by Inventor Faju Qiu

Faju Qiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11892293
    Abstract: A platform gauge instrument and a platform gauge measuring method based on a photogrammetric principle are provided. According to the platform gauge instrument, measuring stations are arranged on both sides of a platform, and the measuring stations on both sides work together to ensure the acquisition of complete platform information. The measuring stations have automatic traveling capability to complete scanning of a whole platform, platform information obtained by the scanning is automatically resolved by a measuring system, and gauge dimensions such as a transverse dimension and a vertical dimension of a platform gauge are resolved through parameters such as object-space coordinates of platform edge points, a space equation of intersection lines of upper surfaces of rails and a measuring cross-section, and common tangent lines of the upper surfaces of two rails on the measuring cross-section, so that resident and real-time gauge high-precision detection of the platform is achieved.
    Type: Grant
    Filed: May 17, 2023
    Date of Patent: February 6, 2024
    Assignee: NINGBO SPECIAL EQUIPMENT INSPECTION AND RESEARCH INSTITUTE
    Inventors: Faju Qiu, Wei Chen, Jijie Yang, Xiangning Kuang, Gaoyao Ding, Yiyi Zhang, Jianer Wang, Jinhui Yang
  • Publication number: 20240035819
    Abstract: A platform gauge instrument and a platform gauge measuring method based on a photogrammetric principle are provided. According to the platform gauge instrument, measuring stations are arranged on both sides of a platform, and the measuring stations on both sides work together to ensure the acquisition of complete platform information. The measuring stations have automatic traveling capability to complete scanning of a whole platform, platform information obtained by the scanning is automatically resolved by a measuring system, and gauge dimensions such as a transverse dimension and a vertical dimension of a platform gauge are resolved through parameters such as object-space coordinates of platform edge points, a space equation of intersection lines of upper surfaces of rails and a measuring cross-section, and common tangent lines of the upper surfaces of two rails on the measuring cross-section, so that resident and real-time gauge high-precision detection of the platform is achieved.
    Type: Application
    Filed: May 17, 2023
    Publication date: February 1, 2024
    Applicant: NINGBO SPECIAL EQUIPMENT INSPECTION AND RESEARCH INSTITUTE
    Inventors: Faju QIU, Wei CHEN, Jijie YANG, Xiangning KUANG, Gaoyao DING, Yiyi ZHANG, Jianer WANG, Jinhui YANG