Abstract: The disclosure relates to the field of information processing, and more particularly to a method, electronic device and storage medium for information processing. According to the embodiments of the disclosure, the method of information processing includes: establishing an association relationship between a first application and a first file, the first application being a program for processing a service processing flow; determining service processing flow information of the first application; and displaying first information corresponding to the service processing flow information at a predetermined position in the first file. The method of information processing provided by the embodiments of the disclosure enables users to conveniently obtain service processing flow information related to the first file through the first file, and facilitates subsequent audit and review of the file or the corresponding service processing flow.

Abstract: The disclosure relates to the field of computers, and particularly to a method, apparatus, electronic device and storage medium for information processing. The method of information processing provided in the present disclosure includes: at a time before the end of a service processing flow about a first file, determining a save strategy for the first file in response to a user operation, so that the first file is saved based on the save strategy after the end of the service processing flow.

Abstract: The disclosure provides a method, apparatus, terminal and storage medium for service processing based on an online document. The method includes: determining a first application; establishing an association between the first application and a first online document; and performing a first processing on the first online document according to the information related to the first application. The information processing method provided by embodiments of the present disclosure can process the first online document based on the information related to the first application, so that the data processing of the first online document can adapt to the service logic of the first application itself. While fully utilizing the characteristics of openness and easy collaboration of the online document, the online document can reflect or adapt to the service logic, and improve the flexibility and stability of the service.

Abstract: A method of data processing for an application includes displaying service data in a first display area of a first application display interface; displaying first online document information in a second display area of a first application display interface, the first online document carrying a file required for processing the service data; and processing the service data in response to a first operation initiated based on the content carried by the first online document. The method of data processing for an application displays business data and the first online document in the first display area and the second display area respectively, and operates the business data based on the first operation initiated by the content carried by the first online document, so that the processing method of business data is associated with the content carried by the first online document, thereby improving the flexibility and convenience of business data processing.

Abstract: This disclosure provides a method and apparatus, terminal and storage medium for information processing. The method of information processing includes: receiving a first document for processing a business flow, the business flow comprising one or more business nodes; and when a predetermined operation is performed on a content of the first document, determining an associated person associated with at least one business node of the business flow based on the predetermined operation, and sending a notification message to the associated person.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: The present disclosure describes techniques for displaying comments on videos. The disclosed techniques include obtaining a first list comprising a plurality of comment messages and a second list configured to store address information corresponding to at least one reusable comment style; determining whether the second list comprises the address information in response to a determination that a target comment message among the plurality of comment messages is initialized; selecting a piece of address information corresponding to a target comment style among the at least one reusable comment style in response to a determination that the second list comprises the address information; and generating a target comment object based on the target comment message and the target comment style corresponding to the selected piece of address information, wherein the target comment style comprises data indicative of effects of presenting the target comment message on a display device.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: The present disclosure describes techniques for displaying comments on videos. The disclosed techniques include obtaining a first list comprising a plurality of comment messages and a second list configured to store address information corresponding to at least one reusable comment style; determining whether the second list comprises the address information in response to a determination that a target comment message among the plurality of comment messages is initialized; selecting a piece of address information corresponding to a target comment style among the at least one reusable comment style in response to a determination that the second list comprises the address information; and generating a target comment object based on the target comment message and the target comment style corresponding to the selected piece of address information, wherein the target comment style comprises data indicative of effects of presenting the target comment message on a display device.

Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.

Abstract: A test apparatus for testing electrical parameters of a target chip, the apparatus including: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.

Abstract: Techniques for displaying comment information are described herein. A method includes playing the target video, displaying the comments information associated with a video when said video is being played, displaying the social functions corresponding to said specific comment information when receiving the selection command corresponding to the specific comments information currently displayed, receiving the social information sending command corresponding to said social functions, obtaining the command inputted by the user on said social function panel, displaying said command corresponding to said specific comments information, and sending the server a request to add said command of said specific comments information so that said server will add said command into the comments information of said target video and record said command as the social information of said specific comments information. This invention allows the user to use more social functions when using the comments.

Abstract: The present invention discloses a popping-screen push system which includes: a popping-screen server which receives a text or image information, transfer it into a popping-screen message, stores and manages the popping-screen message, and adds it into a broadcast request; a broadcasting server which receives a broadcast request from the popping-screen server and sends out the popping-screen message in the broadcast request in real time; a popping-screen player which receives the popping-screen message from the broadcast server, downloads and plays the popping-screen. The present invention is provided with a broadcasting server, and provides identification codes for respective popping-screen messages, videos, and popping-screen players. Thus, it is convenient for popping-screen management and thereby realizes a high efficiency of polling for users and the popping-screens.

Abstract: An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.

Abstract: A test apparatus for testing electrical parameters of a target chip, the apparatus including: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.