Patents by Inventor Fang-Chi Kan

Fang-Chi Kan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240115222
    Abstract: A fine atomic clock includes a particle source, an MW filter, an atomic gun, a Magneto-MW Trap (MMT) unit, an energy injection unit, and a probing unit. The particle source emits particles. The MW filter receives the particles and generates a plurality of coherent MW of particle beams. The particle beams forms a virtual space-time lattice in an enclosed space. The atomic gun emits a sample. The MMT unit utilizes a magnetic field to trap the sample in the virtual space-time lattice, and utilizes the particle beams to cool down the sample. The sample corresponds to fermions or molecules. The energy injection unit injects energy into the sample to activate the sample into an excitation state. The probing unit activates emission of the sample. An emission frequency of the sample corresponds to a characteristic emission frequency of the sample, and the emission frequency generates a standard time signal.
    Type: Application
    Filed: November 29, 2023
    Publication date: April 11, 2024
    Inventors: Weng-Dah Ken, Fang-Chi Kan
  • Patent number: 11903755
    Abstract: A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: February 20, 2024
    Inventors: Weng-Dah Ken, Fang-Chi Kan
  • Publication number: 20200397391
    Abstract: A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.
    Type: Application
    Filed: June 24, 2020
    Publication date: December 24, 2020
    Inventors: Weng-Dah Ken, Fang-Chi Kan
  • Publication number: 20170281102
    Abstract: A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.
    Type: Application
    Filed: March 30, 2017
    Publication date: October 5, 2017
    Inventors: Weng-Dah Ken, Fang-Chi Kan