Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: A direct current controller includes a rectifier configured to convert alternating current input into a direct current output. A converter electrically coupled to the rectifier generates a converted direct current voltage that regulates a converted direct current from the direct current output of the rectifier and synthesizes an ac component of an alternating current grid to counteract an induced back-emf. A direct current controller central controller coupled to the converter regulates the converted direct current.

Abstract: A direct current controller includes a rectifier configured to convert alternating current input into a direct current output. A converter electrically coupled to the rectifier generates a converted direct current voltage that regulates a converted direct current from the direct current output of the rectifier and synthesizes an ac component of an alternating current grid to counteract an induced back-emf. A direct current controller central controller coupled to the converter regulates the converted direct current.

Abstract: A multilevel voltage source inverter and related control scheme in which a VSI controller operates in a low frequency mode of operation below a threshold operating frequency to more evenly distribute the duty cycle and thermal loss of the VSI switches. The technique makes use of multiple alternative switching states which achieve the same output voltage.

Abstract: A high power motor drive converter includes: a five level hybrid NPC output power conversion stage including three NPC phase bridges having switches and coupled in a wye configuration through a converter neutral point, each NPC phase bridge receiving power on a respective direct current bus; three isolated split series-connected DC capacitor banks each coupled in parallel to a respective one of the three NPC phase bridges; and a controller for selecting switch positions with active control of neutral voltages. The controller is adapted to select switch positions using feedforward sine-triangle modulation with third harmonic injection, zero sequence injection, and/or discontinuous modulation injection.