Patents by Inventor Ferdinand A. Thiel

Ferdinand A. Thiel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detection of defects in semiconductor materials
    Patent number: 4316765
    Abstract: Defect densities in InP and InP.sub.x As.sub.1-x crystals and particularly in zinc-doped LEC-pulled InP crystals are accurately detected using a specific etchant to produce etch pits corresponding to defect sites. This etchant includes H.sub.2 O.sub.2, H.sub.2 SO.sub.4, and water.
    Type: Grant
    Filed: December 8, 1980
    Date of Patent: February 23, 1982
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventor: Ferdinand A. Thiel