Abstract: There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.

Abstract: There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

Abstract: There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.

Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.

Abstract: There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.

Abstract: Object recognition apparatus and methods useful for extracting information from an input signal. In one embodiment, the input signal is representative of an element of an image, and the extracted information is encoded into patterns of pulses. The patterns of pulses are directed via transmission channels to a plurality of detector nodes configured to generate an output pulse upon detecting an object of interest. Upon detecting a particular object, a given detector node elevates its sensitivity to that particular object when processing subsequent inputs. In one implementation, one or more of the detector nodes are also configured to prevent adjacent detector nodes from generating detection signals in response to the same object representation. The object recognition apparatus modulates properties of the transmission channels by promoting contributions from channels carrying information used in object recognition.

Abstract: Sensory input processing apparatus and methods useful for adaptive encoding and decoding of features. In one embodiment, the apparatus receives an input frame having a representation of the object feature, generates a sequence of sub-frames that are displaced from one another (and correspond to different areas within the frame), and encodes the sub-frame sequence into groups of pulses. The patterns of pulses are directed via transmission channels to detection apparatus configured to generate an output pulse upon detecting a predetermined pattern within received groups of pulses that is associated with the feature. Upon detecting a particular pattern, the detection apparatus provides feedback to the displacement module in order to optimize sub-frame displacement for detecting the feature of interest.

Abstract: Sensory input processing apparatus and methods useful for adaptive encoding and decoding of features. In one embodiment, the apparatus receives an input frame having a representation of the object feature, generates a sequence of sub-frames that are displaced from one another (and correspond to different areas within the frame), and encodes the sub-frame sequence into groups of pulses. The patterns of pulses are directed via transmission channels to detection apparatus configured to generate an output pulse upon detecting a predetermined pattern within received groups of pulses that is associated with the feature. Upon detecting a particular pattern, the detection apparatus provides feedback to the displacement module in order to optimize sub-frame displacement for detecting the feature of interest.

Abstract: Object recognition apparatus and methods useful for extracting information from an input signal. In one embodiment, the input signal is representative of an element of an image, and the extracted information is encoded into patterns of pulses. The patterns of pulses are directed via transmission channels to a plurality of detector nodes configured to generate an output pulse upon detecting an object of interest. Upon detecting a particular object, a given detector node elevates its sensitivity to that particular object when processing subsequent inputs. In one implementation, one or more of the detector nodes are also configured to prevent adjacent detector nodes from generating detection signals in response to the same object representation. The object recognition apparatus modulates properties of the transmission channels by promoting contributions from channels carrying information used in object recognition.