Patents by Inventor Francois Detcheverry

Francois Detcheverry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10438626
    Abstract: Methods to pattern substrates with dense periodic nanostructures that combine top-down lithographic tools and self-assembling block copolymer materials are provided. According to various embodiments, the methods involve chemically patterning a substrate, depositing a block copolymer film on the chemically patterned imaging layer, and allowing the block copolymer to self-assemble in the presence of the chemically patterned substrate, thereby producing a pattern in the block copolymer film that is improved over the substrate pattern in terms feature size, shape, and uniformity, as well as regular spacing between arrays of features and between the features within each array compared to the substrate pattern. In certain embodiments, the density and total number of pattern features in the block copolymer film is also increased. High density and quality nanoimprint templates and other nanopatterned structures are also provided.
    Type: Grant
    Filed: November 9, 2015
    Date of Patent: October 8, 2019
    Assignees: WISCONSIN ALUMNI RESEARCH FOUNDATION, WESTERN DIGITAL TECHNOLOGIES
    Inventors: Paul F. Nealey, Huiman Kang, Francois Detcheverry, Juan J. de Pablo, Ricardo Ruiz, Thomas Albrecht
  • Publication number: 20160133292
    Abstract: Methods to pattern substrates with dense periodic nanostructures that combine top-down lithographic tools and self-assembling block copolymer materials are provided. According to various embodiments, the methods involve chemically patterning a substrate, depositing a block copolymer film on the chemically patterned imaging layer, and allowing the block copolymer to self-assemble in the presence of the chemically patterned substrate, thereby producing a pattern in the block copolymer film that is improved over the substrate pattern in terms feature size, shape, and uniformity, as well as regular spacing between arrays of features and between the features within each array compared to the substrate pattern. In certain embodiments, the density and total number of pattern features in the block copolymer film is also increased. High density and quality nanoimprint templates and other nanopatterned structures are also provided.
    Type: Application
    Filed: November 9, 2015
    Publication date: May 12, 2016
    Inventors: Paul F. Nealey, Huiman Kang, Francois Detcheverry, Juan J. de Pablo, Ricardo Ruiz, Thomas Albrecht
  • Patent number: 9183870
    Abstract: Methods to pattern substrates with dense periodic nanostructures that combine top-down lithographic tools and self-assembling block copolymer materials are provided. According to various embodiments, the methods involve chemically patterning a substrate, depositing a block copolymer film on the chemically patterned imaging layer, and allowing the block copolymer to self-assemble in the presence of the chemically patterned substrate, thereby producing a pattern in the block copolymer film that is improved over the substrate pattern in terms feature size, shape, and uniformity, as well as regular spacing between arrays of features and between the features within each array compared to the substrate pattern. In certain embodiments, the density and total number of pattern features in the block copolymer film is also increased. High density and quality nanoimprint templates and other nanopatterned structures are also provided.
    Type: Grant
    Filed: December 5, 2008
    Date of Patent: November 10, 2015
    Assignees: Wisconsin Alumni Research Foundation, HGST Netherlands B.V.
    Inventors: Paul Franklin Nealey, Huiman Kang, Francois Detcheverry, Juan J. De Pablo, Ricardo Ruiz, Thomas Albrecht
  • Publication number: 20090196488
    Abstract: Methods to pattern substrates with dense periodic nanostructures that combine top-down lithographic tools and self-assembling block copolymer materials are provided. According to various embodiments, the methods involve chemically patterning a substrate, depositing a block copolymer film on the chemically patterned imaging layer, and allowing the block copolymer to self-assemble in the presence of the chemically patterned substrate, thereby producing a pattern in the block copolymer film that is improved over the substrate pattern in terms feature size, shape, and uniformity, as well as regular spacing between arrays of features and between the features within each array compared to the substrate pattern. In certain embodiments, the density and total number of pattern features in the block copolymer film is also increased. High density and quality nanoimprint templates and other nanopatterned structures are also provided.
    Type: Application
    Filed: December 5, 2008
    Publication date: August 6, 2009
    Applicants: Wisconsin Alumni Research Foundation, Hitachi Global Storage Technologies, Inc
    Inventors: Paul Franklin NEALEY, Huiman Kang, Francois Detcheverry, Juan J. De Pablo, Ricardo Ruiz, Thomas Albrecht