Abstract: The present invention relates to a high-resolution scanning surface-plasmon microscope including a source (LG) of coherent light and a medium for coupling and confining a surface plasmon including an objective (O, OM) with a large numerical aperture, immersion oil (Hi), and a glass cover slip (GS). A metal layer (MS) covers a surface of the glass cover slip (GS). The microscope also includes a heterodyne-mode Twyman-Green interferometer placed between the light source and means (PL1, PL2, EC) for scanning the metal layer using a light beam and means (PD) for detecting the beam from the interferometer connected to processing means (S, F, DTec, COMP) for forming an image from that beam. According to the invention, at least one polarization converter (CP) for converting the light beams (L) emitted by the light source (LG) from linear polarization to radial polarization is disposed between the light source and the interferometer.

Abstract: The present invention relates to a high-resolution surface plasmon microscope including a heterodyne interferometer (6) for splitting an excitation light beam into at least one reference beam and at least one measurement beam directed toward a coupling medium (7) to generate a surface plasmon, said heterodyne interferometer consists essentially of guide optical fibers (12, 13, 14, 15) optically connected at a first of their ends to an optical coupler (16) and each also optically connected at their second end to a light source (1), an optical coupling medium (7), an element (17) for reflecting the reference beam, and means (28) for detecting an interferometer beam, respectively.

Abstract: The present invention relates to a high-resolution scanning surface-plasmon microscope including a source (LG) of coherent light and a medium for coupling and confining a surface plasmon including an objective (O, OM) with a large numerical aperture, immersion oil (Hi), and a glass cover slip (GS). A metal layer (MS) covers a surface of the glass cover slip (GS). The microscope also includes a heterodyne-mode Twyman-Green interferometer placed between the light source and means (PL1, PL2, EC) for scanning the metal layer using a light beam and means (PD) for detecting the beam from the interferometer connected to processing means (S, F, DTec, COMP) for forming an image from that beam. According to the invention, at least one polarization converter (CP) for converting the light beams (L) emitted by the light source (LG) from linear polarization to radial polarization is disposed between the light source and the interferometer.