Abstract: In an embodiment a method for position determination of an object in a spatial area is provided in which the object is illuminated with at least one light beam. The light beam does not cover the complete spatial area and is guided into a part of the spatial area in which the object is present depending on the position of the object. In another aspect a method for measuring a surface is provided.

Abstract: A measuring unit set up to determine a relative position and relative orientation between the measuring unit and an arrangement of at least three optical elements. The measuring unit comprises a length measuring device, which emits measuring beams at at least three locations spaced apart from one another, and at least one beam directing device set up to direct the measuring beams to optical elements of the arrangement. The beam directing device is controllable in order to guide at least one of the measuring beams to a plurality of optical elements of the arrangement in a time-sequential manner in order to carry out a plurality of length measuring operations in a time-sequential manner in such a manner that, in the plurality of length measuring operations, each measuring beam of the at least one measuring beam strikes precisely one of the optical elements. A total of six lengths are measured in this manner.

Abstract: In an embodiment a method for position determination of an object (25) in a spatial area (28) is provided in which the object (25) is illuminated with at least one light beam (22, 27). The light beam (22, 27) does not cover the complete spatial area (28) and is guided into a part of the spatial area in which the object (25) is present depending on the position of the object (25). In another aspect a method for measuring a surface is provided.

Abstract: An evaluation device, measuring arrangement and method for path length measurement. The evaluation device for path length measurement is configured to evaluate a measured signal which represents an intensity of a sequence of pulses of electromagnetic radiation as a function of time. The sequence of pulses has a repetition rate. The evaluation device is configured to determine a phase difference between a component of the measured signal, the component oscillating with a frequency, and a reference signal which oscillates with the frequency. For this purpose, the evaluation device generates, for example by frequency mixing, a first signal and a second signal which have another phase difference, such that the first signal and the second signal each oscillates with another frequency which is different from said frequency, and that the other phase difference has a predetermined relation to the phase difference.

Abstract: An evaluation device for path length measurement configured to evaluate a measured signal representing an intensity of a sequence of pulses of electromagnetic radiation, particularly a sequence of light pulses, as a function of time, after the sequence has traveled through a path length to be measured. The sequence of light pulses is generated with a repetition rate by a radiation source, particularly a light source. The evaluation device is configured to evaluate a first component of the measured signal, which oscillates with a first frequency, and a second component of the measured signal, which the second component oscillates with a second frequency that is greater than the first frequency. The first frequency may correspond to the repetition rate or a multiple of the repetition rate. The second frequency may correspond to another multiple of the repetition rate.

Abstract: A device for measuring a surface (2) comprises a light source (3), a light directing device (4-6), a detector arrangement (10) and an evaluation circuit (15). The light source (3) generates a sequence of light pulses with a repetition rate. The light directing device (4-6) is controllable to direct the sequence of light pulses onto a surface area (25) of the surface (2). The surface area may be selected from plural surface areas (25, 27). The detector arrangement is configured to receive at least one light signal (21-24) scattered and/or reflected by the surface area (25). The evaluation circuit (15) is coupled to the detector arrangement (10) and is configured to determine a phase difference between a reference signal (19) derived from the sequence of light pulses and a signal component of the at least one light signal (21-24), in order to determine a position of the surface area (25).

Abstract: A device for determining a position of an object (25) in a spatial region (28) comprises a light source (3), a light directing device (4-9), at least one reference signal detector (11, 12) and a detector arrangement (13, 14). The light source (3) generates a sequence of light pulses with a repetition rate. The light directing device (4-9) directs the sequence of light pulses into the spatial region (28) and, as a reference signal (20), to the at least one reference signal detector (11, 12). The detector arrangement (13, 14) detects a plurality of light signals (23, 24) which are reflected and/or scattered by the object (25) in the spatial region (28) into a plurality of different directions by reflection and/or scattering of the sequence of light pulses.

Abstract: A bearing arrangement (9) for a tine carrier (5) on a reel (1) of a harvester has first and second bearing elements and an attachment mechanism. The first bearing element is in the form of a bearing bushing (10) with a bearing bore (16) to rotatably support a tine carrier (5) around a rotational axis D. The attachment mechanism (17) attaches the bearing bushing (10) onto a support element (7) of the reel (1). The second bearing element is in the form of a bearing ring (25). The bearing ring (25) is fixable onto the tine carrier (5). The bearing ring (25) has a first ring portion (26) and a second ring portion (27). The ring portions (26, 27) are detachably connected to each other.

Abstract: An apparatus (3) for determining centering data for eyeglasses (2) comprises a fixation device (5) and a recording unit (4) that can be triggered by a computer, records electronic images, and is disposed behind a divider element (8). The fixation device (5) produces at least one speckle pattern. The speckles can be superposed by different patterns, for example, a cross shape. The invention further relates to a method for determining centering data. The inventive method and apparatus allow to measure for test persons having the most different acuity of vision the relative centering data from a short distance while maintaining their usual posture.

Abstract: A mirror arrangement for reflecting electromagnetic radiation, the mirror arrangement comprising: a substrate having a mirror side facing towards the radiation to be reflected and a back side opposite to the mirror side, wherein a mirror surface is provided on the mirror side and wherein an actuator arrangement for generating a deformation of the substrate is mounted on the back side of the substrate, wherein the actuator arrangement comprises at least one active layer having an areal adhering contact with a portion of the back side of the substrate; wherein the at least one active layer has a first layer thickness at a first location within the portion and a second layer thickness at a second location disposed at a distance from the first location within the portion, wherein the first layer thickness differs from the second layer thickness by more than 1%; and wherein the at least one active layer comprises at least one of a ferroelectric material, a piezoelectric material, a magnetostrictive material, an el

Abstract: A diffraction-optical component for providing a radiation-diffracting grating structure is proposed, comprising a surface wave device including a substrate 43, a surface wave source 47 excitable with an adjustable frequency for producing surface waves on a surface 45 of the substrate 43 and an interaction region 17 of the substrate surface 45 which is provided for the radiation to interact with a grating structure provided by the surface waves produced.

Abstract: A spectrometer arrangement is disclosed for the determination of a radiation wavelength of radiation emitted from a radiation source to be measured. The arrangement includes a diffraction grating on which the radiation of the radiation source to be measured is incident at a predetermined angle, wherein the diffraction grating is provided by a reflection grating having a variable lattice constant. The arrangement also includes a radiation detector for receiving from the radiation source to be measured radiation diffracted at a predetermined angle at the diffraction grating.

Abstract: A system and a method for determining a position of two objects relative to each other is suggested, comprising: a source 43 of coherent radiation, a beam guidance for providing a measuring branch 49 for a measuring beam, which has an optical path length dependent on the position of the two objects, a radiation intensity sensor 65 for measuring an intensity of an interfering superposition of radiation, which include radiation at least after passing through the measuring branch 49, and a calculator 67 which responds to a measuring signal from the radiation intensity sensor 65, in order to detect optical path lengths of the measuring branch 49 and therefrom to detect the position of the two objects relative to each other, wherein the measuring branch 49 includes: at least one emitter fixedly mountable on a first of the two objects for emitting radiation supplied to the measuring branch 49 in a space between the two objects, at least three retroreflectors 19 mountable on the second one of the two objects, such t

Abstract: An active mirror has a reflectively coated diaphragm, a mount, and at least one actuator, in which a second diaphragm is connected to the mount, and the actuator is operatively connected to the two diaphragms. The active mirror is symmetrical with respect to a midplane.