Abstract: Embodiments relate to importing files or a file set from a library as an import set and dynamically extracting and compiling the import set at run-time. The library stores one or more files and any incremental changes to the files. Versioning information is read from the import set. Import of the files from the library is limited to dependencies that are needed to support program execution. The import set transforms the program, and in one embodiment modifies execution of the program. At run-time, non-compiled program code of the import set is compiled with the program to dynamically execute the program.

Abstract: A computer system includes a processor, and the processor includes at least one interface for communicating with an electronic component. Each of the at least one interface has a set of interface settings. The computer system further includes a memory containing machine executable instructions. Execution of the instructions causes the processor to: monitor communications traffic on the at least one interface; store, eye distribution data acquired during the monitoring of the communications traffic in a database; compare the eye distribution data to a set of predetermined criteria; and generate a set of updated interface settings if the eye distribution does not satisfy the set of predetermined criteria.

Abstract: A computer system includes a processor, and the processor includes at least one interface for communicating with an electronic component. Each of the at least one interface has a set of interface settings. The computer system further includes a memory containing machine executable instructions. Execution of the instructions causes the processor to: monitor communications traffic on the at least one interface; store, eye distribution data acquired during the monitoring of the communications traffic in a database; compare the eye distribution data to a set of predetermined criteria; and generate a set of updated interface settings if the eye distribution does not satisfy the set of predetermined criteria.

Abstract: A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.

Abstract: A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.

Abstract: A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.

Abstract: A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.

Abstract: An electronics systems having variable interconnections among major components is tested by dynamically identifying the locations and types of all system components at the time the test is to be performed, for building a global model describing the interconnections among these components. Specific tests appropriate for this model are then dynamically generated and executed. Data on the components themselves identifies them. The tests employ boundary-scanning techniques to locate failing drivers, receivers, and bidirectional driver/receivers, as well as open and shorted interconnections.