Abstract: A method is provided for performing electron diffraction pattern analysis upon a sample in a vacuum chamber of a microscope. Firstly a sample is isolated from part of a specimen using a focused particle beam. A manipulator end effector is then attached to the sample so as to effect a predetermined orientation between the end effector and the sample. With the sample detached, the manipulator end effector is rotated about a rotation axis to bring the sample into a predetermined geometry with respect to an electron beam and diffraction pattern imaging apparatus so as to enable an electron diffraction pattern to be obtained from the sample while the sample is still fixed to the manipulator end effector. An electron beam is caused to impinge upon the sample attached to the manipulator end effector so as to obtain an electron diffraction pattern.

Abstract: A system for monitoring positioning of a machine is disclosed. The system includes an IMU located at a first location on the machine and configured to generate positioning data associated with the first location. The system includes a machine controller operatively associated with the machine. The machine controller is configured to determine predicted positioning data for a second location on the machine based on positioning data associated with the first location. The machine controller is further configured to generate a virtual IMU at the second location based on the predicted positioning data for the second location, wherein the virtual IMU generates virtual positioning data for the second location. The system further includes an application controller operatively associated with the machine controller and configured to use the virtual positioning data as input data for one or more machine-associated applications.

Abstract: A method is provided for performing electron diffraction pattern analysis upon a sample in a vacuum chamber of a microscope. Firstly a sample is isolated from part of a specimen using a focused particle beam. A manipulator end effector is then attached to the sample so as to effect a predetermined orientation between the end effector and the sample. With the sample detached, the manipulator end effector is rotated about a rotation axis to bring the sample into a predetermined geometry with respect to an electron beam and diffraction pattern imaging apparatus so as to enable an electron diffraction pattern to be obtained from the sample while the sample is still fixed to the manipulator end effector. An electron beam is caused to impinge upon the sample attached to the manipulator end effector so as to obtain an electron diffraction pattern.

Abstract: A method of determining a heading of a machine having an implement is provided. The method includes determining a first heading data of the machine using an inertial sensor. The method includes determining a second heading data of the machine using a magnetometer. The method includes determining a position of the implement in a stationary state. The method also includes calculating a corrected second heading data based on a predefined relation between the position of the implement in the stationary state and the second heading data. The method further includes determining the heading of the machine based on the first heading data and the corrected second heading data.

Abstract: A method of determining a location of a machine is provided. The method includes determining a location of the machine based on the signals received from an IMU at each of a plurality of unit time. The method also includes determining a location of the machine corresponding to a first unit time based on signals received from the satellite positioning unit at a second unit time. The method includes determining an error associated with the location of the machine, by a processing unit, based on the location determined by the satellite positioning unit and the location determined based on the signals received from the IMU at a unit time successive to the first unit time. The method also includes adding the error to the location of the machine determined based on the signals received from the IMU at a successive unit time to the second unit time.

Abstract: A method of determining a heading of a machine having an implement is provided. The method includes determining a first heading data of the machine using an inertial sensor. The method includes determining a second heading data of the machine using a magnetometer. The method includes determining a position of the implement in a stationary state. The method also includes calculating a corrected second heading data based on a predefined relation between the position of the implement in the stationary state and the second heading data. The method further includes determining the heading of the machine based on the first heading data and the corrected second heading data.

Abstract: A system having a primary inertial measurement unit and a secondary inertial measurement unit configured to generate a primary position signal and a secondary position signal respectively is provided. The system also includes an error detection module communicably coupled to the primary inertial measurement unit and the secondary inertial measurement unit. The error detection module is configured to receive the primary position signal and the secondary position signal and detect if an out-range error is present in at least one of the primary position signal and the secondary position signal. The error detection module is also configured to detect if an in-range error is present in at least one of the primary position signal and the secondary position signal and determine an action to be performed based on the presence of at least one of the out-range error and the in-range error.

Abstract: A hemodialysis needle assembly and system that includes a first outer needle having a conical tip and a sidewall where the sidewall has a plurality of apertures located adjacent the tip, a second introducer needle located within the outer needle, a guide wire located within the introducer needle, and a spring motor removably secured to the outer needle. The introducer needle and the guide wire are inserted into a patient's vein and the spring motor releases the outer needle into the vein after the introducer needle and the guide wire are properly placed within the patient. The introducer needle, the guide wire, and the spring motor are removed from the patient after the outer needle is in place within the vein.

Abstract: A column for liquid chromatography includes a chamber adapted to receive packing medium. Openings in the chamber allow fluid to pass through it. Porous plugs in the chamber retain the packing medium. A piston and one porous plug are movable within the chamber to compress the packing medium. A fitting engages the piston and is adjustably movable for moving the piston.

Abstract: Guard columns for high-pressure liquid chromatography (HPLC) apparatuses. These guard columns can be removable and/or metallic guard columns. Further, all of the outlet of the guard column can substantially engage the inlet of an HPLC column in the HPLC apparatus. Also, an HPLC apparatus that includes a guard column, a hand-tightened top end fitting at a first end of the HPLC apparatus and a hand-tightened bottom end fitting at a second end of the HPLC apparatus.

Abstract: Guard columns for high-pressure liquid chromatography (HPLC) apparatuses. These guard columns can be removable and/or metallic guard columns. Further, all of the outlet of the guard column can substantially engage the inlet of an HPLC column in the HPLC apparatus. Also, an HPLC apparatus that includes a guard column, a hand-tightened top end fitting at a first end of the HPLC apparatus and a hand-tightened bottom end fitting at a second end of the HPLC apparatus.

Abstract: Data acquisition times from a component under test in resonant ultrasound spectroscopy are decreased. A proximity of each data acquisition point to a resonant response of the component is monitored. A dwell time between successive data acquisition points is then adjusted as a function of the proximity to a resonant response. In one embodiment, each component response is compared to a preselected threshold value and the dwell time between adjacent data points is increased when the response exceeds the threshold value, indicating the response is nearing a resonance. The dwell time is decreased between resonant responses to decrease the data acquisition time.

Abstract: A medico-surgical suction system has a container with an outlet connected to a vacuum pump and an inlet connected to a suction catheter via a dual-lumen tube assembly one end of which is connected to the container and the other end of which is has a suction control and a coupling for the catheter. A valve located in the outlet of the container is connected to the suction control via a minor lumen of the tube. A side lumen enables the vacuum pump to apply reduced pressure to one end of the valve which holds the valve off against the action of a spring. Actuation of the suction control allows air to flow to the valve via the minor lumen so that the effect of the reduced pressure is overcome and the spring opens the valve.