Patents by Inventor Frederic MORROW

Frederic MORROW has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for display of non-destructive testing region
    Patent number: 10295503
    Abstract: A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.
    Type: Grant
    Filed: October 15, 2015
    Date of Patent: May 21, 2019
    Assignee: ZETEC, INC.
    Inventors: Laurent Enenkel, Frederic Morrow, Alexandre Charlebois, Martin Garneau, Stephane Turgeon
  • SYSTEM FOR DISPLAY OF NON-DESTRUCTIVE TESTING REGION
    Publication number: 20170241956
    Abstract: A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.
    Type: Application
    Filed: October 15, 2015
    Publication date: August 24, 2017
    Inventors: Laurent ENENKEL, Frederic MORROW, Alexandre CHARLEBOIS, Martin GARNEAU, Stephane TURGEON
  • System and method for ultrasonic testing
    Patent number: 8738339
    Abstract: A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: May 27, 2014
    Assignee: Zetec, Inc.
    Inventors: Daniel Richard, Dirk Verspeelt, Frederic Morrow, Guy Maes, Jean-Francois Tremblay, Martin Garneau, Stephane Turgeon, Alexandre Charlebois
  • System and method for ultrasonic testing
    Publication number: 20100094606
    Abstract: A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.
    Type: Application
    Filed: October 5, 2009
    Publication date: April 15, 2010
    Inventors: Daniel RICHARD, Dirk VERSPEELT, Frederic MORROW, Guy MAES, Jean-Francois TREMBLAY, Martin GARNEAU, Stephane TURGEON, Alexandre CHARLEBOIS