Abstract: A system and a method for measuring the profile of a part. The measurement system includes a sensor with a probe having at least one degree of freedom, and a first reference element fastened to the probe. The sensor is arranged so that the probe is able to follow the internal or external contour of the part while the first reference element is outside the part. An imaging device is adapted to capture an image representing at least a portion of the outside of the part and the first reference element. Thus, the first reference element serves as a reference element for the position of the probe relative to the reference system that is the part.

Abstract: A machine-tool including a machining module equipped with a tool-holder and a work-holder, and an optical measuring device-for the three-dimensional measurement of the relative position between the tool-holder and the work-holder. The optical measuring device includes an optical system mounted on the work-holder and a target mounted on the tool-holder. The target includes a useful face forming a positioning reference that can be placed in the optical axis of the optical system.

Abstract: A three-dimensional target capable of serving as a positioning reference, including, on a useful face, a first structure and a second structure. The first structure defines a planar reference face divided up between at least a first portion whose surface is reflective according to a diffuse reflection, and a second portion whose surface is reflective according to a specular reflection, the second portion being divided up according to a series of localized zones positioned in the first portion. The second structure has an inclined face relative to the planar reference face. Applicable to three-dimensional optical measurement of the relative position between a first object and a second object.

Abstract: A system and a method for measuring the profile of a part. The measurement system includes a sensor with a probe having at least one degree of freedom, and a first reference element fastened to the probe. The sensor is arranged so that the probe is able to follow the internal or external contour of the part while the first reference element is outside the part. An imaging device is adapted to capture an image representing at least a portion of the outside of the part and the first reference element. Thus, the first reference element serves as a reference element for the position of the probe relative to the reference system that is the part.