Abstract: A particle examination system is provided, including a surface which provs a background such that particles on or suspended above the surface are distinguishable from the background; a video camera, for producing an image of the particles against the surface; and an image processor, connected to the video camera, for digitizing the image. A computer is utilized to analyze the digitized data from the image processor, allowing various types of comparisons to be made between the particles examined and a known standard. Additionally, the invention may include a vacuum device which, through holes on the surface, holds the particles in position for examination. A transparent/translucent or transparent surface may be provided, enabling illumination from beneath such plate, allowing analysis of particles for cracks and fissures.