Patents by Inventor Frederick F. Shaapur

Frederick F. Shaapur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for forensic analysis of electronic components
    Patent number: 10482473
    Abstract: A physical inspection forensic methodology with an inherent reliable fallback option based on the extraction of quantifiable intrinsic manufacturer-specific process signatures present superficially and/or within the electronic component. The methodology will seek to extract such signatures cost-effectively through a tiered application of the most expedited and least intrusive approaches.
    Type: Grant
    Filed: May 5, 2017
    Date of Patent: November 19, 2019
    Inventors: Frederick F. Shaapur, Roger J. Graham
  • METHOD FOR FORENSIC ANALYSIS OF ELECTRONIC COMPONENTS
    Publication number: 20170330201
    Abstract: A physical inspection forensic methodology with an inherent reliable fallback option based on the extraction of quantifiable intrinsic manufacturer-specific process signatures present superficially and/or within the electronic component. The methodology will seek to extract such signatures cost-effectively through a tiered application of the most expedited and least intrusive approaches.
    Type: Application
    Filed: May 5, 2017
    Publication date: November 16, 2017
    Inventors: Frederick F. Shaapur, Roger J. Graham
  • Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy
    Patent number: 8258473
    Abstract: A method and apparatus for in-situ lift-out rapid preparation of TEM samples. The invention uses adhesives and/or spring-loaded locking-clips in order to place multiple TEM-ready sample membranes on a single TEM support grid and eliminates the use of standard FIB-assisted metal deposition as a bonding scheme. Therefore, the invention circumvents the problem of sputtering from metal deposition steps and also increases overall productivity by allowing for multiple samples to be produced without opening the FIB/SEM vacuum chamber.
    Type: Grant
    Filed: March 17, 2011
    Date of Patent: September 4, 2012
    Assignee: Nanotem, Inc.
    Inventors: Frederick F. Shaapur, Roger J. Graham
  • Method and Apparatus for Rapid Preparation of Multiple Specimens for Transmission Electron Microscopy
    Publication number: 20120119084
    Abstract: A method and apparatus for in-situ lift-out rapid preparation of TEM samples. The invention uses adhesives and/or spring-loaded locking-clips in order to place multiple TEM-ready sample membranes on a single TEM support grid and eliminates the use of standard FIB-assisted metal deposition as a bonding scheme. Therefore, the invention circumvents the problem of sputtering from metal deposition steps and also increases overall productivity by allowing for multiple samples to be produced without opening the FIB/SEM vacuum chamber.
    Type: Application
    Filed: March 17, 2011
    Publication date: May 17, 2012
    Applicant: NANOTEM, INC.
    Inventors: Frederick F. Shaapur, Roger J. Graham
  • Methods of examining a specimen and of preparing a specimen for transmission microscopic examination
    Patent number: 6188068
    Abstract: A method of examining a specimen comprising the steps of providing transmission electron microscope apparatus, mounting a specimen in a vacuum chamber of focused ion beam apparatus, isolating a site of the specimen with the focused ion beam apparatus in the vacuum chamber, and with the site located in the vacuum chamber, examining the site with the transmission electron microscope apparatus.
    Type: Grant
    Filed: June 10, 1998
    Date of Patent: February 13, 2001
    Inventors: Frederick F. Shaapur, Roger J. Graham