Abstract: The present invention provides a method and system of chemical identification by using a short wavelength range of near infrared (NIR) such as in the range of near infrared (NIR) of about 600 to about 1100 nm. A silicon-detector can be used to measure the short wavelength of NIR region. A detection signal from a detector is sent to a computer. The computer is programmed with software modules for data acquisition of the detection signal and data analysis to determine absorption spectrum. The computer can include memory or remote access to one or more databases for storing a library of absorption spectra. The absorption spectrum of the material which provides the highest match value is identified as the material under inspection.