Patents by Inventor Fuminori Akiba

Fuminori Akiba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8454758
    Abstract: An electrostatic chuck cleaning process that cleans an electrostatic chuck, equipped in a chamber, for chucking and holding a substrate. This method has a plasma etching process that performs plasma etching on the electrostatic chuck, a substrate mounting process that mounts a substrate on the electrostatic chuck that was subjected to plasma etching in the plasma etching process, and a substrate removal process that removes the substrate that was mounted on the electrostatic chuck in the substrate mounting process.
    Type: Grant
    Filed: January 13, 2006
    Date of Patent: June 4, 2013
    Assignee: Applied Materials, Inc.
    Inventor: Fuminori Akiba
  • Publication number: 20060112970
    Abstract: An electrostatic chuck cleaning process that cleans an electrostatic chuck, equipped in a chamber, for chucking and holding a substrate. This method has a plasma etching process that performs plasma etching on the electrostatic chuck, a substrate mounting process that mounts a substrate on the electrostatic chuck that was subjected to plasma etching in the plasma etching process, and a substrate removal process that removes the substrate that was mounted on the electrostatic chuck in the substrate mounting process.
    Type: Application
    Filed: January 13, 2006
    Publication date: June 1, 2006
    Inventor: Fuminori Akiba
  • Patent number: 7004180
    Abstract: An electrostatic chuck cleaning process that cleans an electrostatic chuck, equipped in a chamber, for chucking and holding a substrate. This method has (1) a plasma etching process that performs plasma etching on the electrostatic chuck, (2) a substrate mounting process that mounts a substrate on the electrostatic chuck that was subjected to plasma etching in the plasma etching process, and (3) a substrate removal process that removes the substrate that was mounted on the electrostatic chuck in the substrate mounting process.
    Type: Grant
    Filed: March 12, 2002
    Date of Patent: February 28, 2006
    Assignee: Applied Materials, Inc.
    Inventor: Fuminori Akiba
  • Publication number: 20020170882
    Abstract: The present invention is a substrate support method wherein a voltage is applied to the electrostatic chuck of a substrate support apparatus equipped in a chamber, thereby using a coulomb force to adsorb and support a substrate mounted on the semiconductor chuck. This substrate support method includes (1) a voltage increasing step that increases the voltage applied to the electrostatic chuck from a base value to a first value that is required for adsorbing the substrate, and (2) a first voltage maintenance step that maintains at the first value the voltage that was increased in the voltage increasing step, and (3) the voltage is increased in steps in the voltage increasing step from the base value to the first value.
    Type: Application
    Filed: February 26, 2002
    Publication date: November 21, 2002
    Inventor: Fuminori Akiba
  • Publication number: 20020153024
    Abstract: An electrostatic chuck cleaning process that cleans an electrostatic chuck, equipped in a chamber, for chucking and holding a substrate. This method has (1) a plasma etching process that performs plasma etching on the electrostatic chuck, (2) a substrate mounting process that mounts a substrate on the electrostatic chuck that was subjected to plasma etching in the plasma etching process, and (3) a substrate removal process that removes the substrate that was mounted on the electrostatic chuck in the substrate mounting process.
    Type: Application
    Filed: March 12, 2002
    Publication date: October 24, 2002
    Inventor: Fuminori Akiba