Patents by Inventor Gangqiang ZHA

Gangqiang ZHA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • CZT semiconductor activity meter and activity measuring device
    Patent number: 11619752
    Abstract: Provided is a CZT semiconductor activity meter and an activity measuring device, which relate to the field of medical apparatus and instruments. The CZT semiconductor activity meter includes a shell, a CZT probe, a package substrate and a processing module, wherein the CZT probe is arranged on an end of the shell, the package substrate is arranged at the middle part of the shell and abuts against an inner wall of the shell, the CZT probe is connected to one side of the package substrate, the other side of the package substrate and the inner wall of the shell together form a package inner cavity, and the processing module is accommodated in the package inner cavity and connected to the package substrate. The CZT semiconductor activity meter has a small volume, is convenient to operate, does not require manual control during detection, and can be used at room temperature.
    Type: Grant
    Filed: January 10, 2019
    Date of Patent: April 4, 2023
    Assignee: SHANXI MEDICAL UNIVERSITY
    Inventors: Sijin Li, Haiyan Liu, Gangqiang Zha
  • CZT SEMICONDUCTOR ACTIVITY METER AND ACTIVITY MEASURING DEVICE
    Publication number: 20220099849
    Abstract: Provided is a CZT semiconductor activity meter and an activity measuring device, which relate to the field of medical apparatus and instruments. The CZT semiconductor activity meter includes a shell, a CZT probe, a package substrate and a processing module, wherein the CZT probe is arranged on an end of the shell, the package substrate is arranged at the middle part of the shell and abuts against an inner wall of the shell, the CZT probe is connected to one side of the package substrate, the other side of the package substrate and the inner wall of the shell together form a package inner cavity, and the processing module is accommodated in the package inner cavity and connected to the package substrate. The CZT semiconductor activity meter has a small volume, is convenient to operate, does not require manual control during detection, and can be used at room temperature.
    Type: Application
    Filed: January 10, 2019
    Publication date: March 31, 2022
    Inventors: Sijin LI, Haiyan LIU, Gangqiang ZHA