Patents by Inventor Garry J. Emge

Garry J. Emge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8707573
    Abstract: A device, system, and method for generating low clearance slidably mated parts. In an exemplary embodiment, the system includes a measurement device having a non-contact micrometer capable of coincidentally indicating opposing edge data, rotational and linear air bearing slides, and a holding device. The non-contact micrometer allows for measurement of a plurality of parameters of a first part including the diameter and the difference between an edge of the first part and a reference point. The coincidental measurements are used to determine the size and geometric errors associated with the first part after suitable error elimination. In an exemplary system, a processing machine may be instructed by the measurement device to remove material from a second part so that the first part and the second part when mated together have a very low clearance tolerance level, e.g., as little as 0.00005 inches or less.
    Type: Grant
    Filed: October 17, 2012
    Date of Patent: April 29, 2014
    Assignee: Sonnax Industries, Inc.
    Inventors: William M. DeRoche, Garry J. Emge
  • Patent number: 8307528
    Abstract: A device, system, and method for generating low clearance slidably mated parts. In an exemplary embodiment, the system includes a measurement device having a non-contact micrometer capable of coincidentally indicating opposing edge data, rotational and linear air bearing slides, and a holding device. The non-contact micrometer allows for measurement of a plurality of parameters of a first part including the diameter and the difference between an edge of the first part and a reference point. The coincidental measurements are used to determine the size and geometric errors associated with the first part after suitable error elimination. In an exemplary system, a processing machine may be instructed by the measurement device to remove material from a second part so that the first part and the second part when mated together have a very low clearance tolerance level, e.g., as little as 0.00005 inches or less.
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: November 13, 2012
    Assignee: Sonnax Industries, Inc.
    Inventors: William M. DeRoche, Garry J. Emge
  • Publication number: 20110078885
    Abstract: A device, system, and method for generating low clearance slidably mated parts. In an exemplary embodiment, the system includes a measurement device having a non-contact micrometer capable of coincidentally indicating opposing edge data, rotational and linear air bearing slides, and a holding device. The non-contact micrometer allows for measurement of a plurality of parameters of a first part including the diameter and the difference between an edge of the first part and a reference point. The coincidental measurements are used to determine the size and geometric errors associated with the first part after suitable error elimination. In an exemplary system, a processing machine may be instructed by the measurement device to remove material from a second part so that the first part and the second part when mated together have a very low clearance tolerance level, e.g., as little as 0.00005 inches or less.
    Type: Application
    Filed: October 5, 2009
    Publication date: April 7, 2011
    Applicant: SONNAX INDUSTRIES, INC.
    Inventors: William M. DeRoche, Garry J. Emge
  • Publication number: 20030011672
    Abstract: A technique for marking pixels on workpieces by routing a scanned beam to different marking stations to mark individual pixels on the workpieces. A diffractive scan lens focuses the beam. A mark is formed on a workpiece by producing the mark and curing the mark. Angular position of a scanning mirror in a raster scanner is determined by moving a beam, reflected from the scanner, across rulings on an optical element during scanning. A print head for printing spots on a surface of a workpiece has a walled, internally pressurized chamber and structure for causing an inked web to conform to a contour of the chamber wall and to be pulled along the chamber wall. A print head has a compliant-walled, internally pressurized chamber. A print head has a chamber having a low-coefficient of friction coating. Two workpieces may be marked at two marking stations by two-directional scanning.
    Type: Application
    Filed: June 19, 2001
    Publication date: January 16, 2003
    Applicant: Markem Corporation, New Hampshire corporation
    Inventors: Garry J. Emge, Stephen W. Carter, David G. Georgis, James T. McCann, Frank A. Meneghini, John S. Deeken, John J. Drake
  • Patent number: 6037968
    Abstract: A technique for marking pixels on workpieces by routing a scanned beam to different marking stations to mark individual pixels on the workpieces. A diffractive scan lens focuses the beam. A mark is formed on a workpiece by producing the mark and curing the mark. Angular position of a scanning mirror in a raster scanner is determined by moving a beam, reflected from the scanner, across rulings on an optical element during scanning. A print head for printing spots on a surface of a workpiece has a walled, internally pressurized chamber and structure for causing an inked web to conform to a contour of the chamber wall and to be pulled along the chamber wall. A print head has a compliant-walled, internally pressurized chamber. A print head has a chamber having a low-coefficient of friction coating. Two workpieces may be marked at two marking stations by two-directional scanning.
    Type: Grant
    Filed: December 6, 1995
    Date of Patent: March 14, 2000
    Assignee: Markem Corporation
    Inventors: Garry J. Emge, Stephen W. Carter, David G. Georgis, James T. McCann