Patents by Inventor Garry Tuohy

Garry Tuohy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering
    Patent number: 7421358
    Abstract: By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.
    Type: Grant
    Filed: October 10, 2006
    Date of Patent: September 2, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Garry Tuohy
  • METHOD AND SYSTEM FOR MEASUREMENT DATA EVALUATION IN SEMICONDUCTOR PROCESSING BY CORRELATION-BASED DATA FILTERING
    Publication number: 20070177135
    Abstract: By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.
    Type: Application
    Filed: October 10, 2006
    Publication date: August 2, 2007
    Inventor: Garry Tuohy