Abstract: A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.

Abstract: A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.

Abstract: A digital system and a method for operating the same. The digital system includes (a) a first and a second pins, (b) first and second logic domains, and (c) first and second test pulse generator circuits. The first test pulse generator circuit is electrically coupled to the first pin and the first logic domain. The second test pulse generator circuit is electrically coupled to the second pin and the second logic domain. When a first test signal and N (positive integer) common test enable signals being asserted, the first test pulse generator circuit generates two first test pulses resulting in the first logic domain being tested. When a second test signal and the N common test enable signals being asserted, the second test pulse generator circuit generates two second test pulses resulting in the second logic domain being tested. The first and second pins are connected to a tester.

Abstract: Built-in self-test (BIST) microcontroller integrated circuit adapted for logic verification. Microcontroller includes a plurality of hardware description language files representing a hierarchical description of the microcontroller, the plurality of hardware description language files including a library of circuit design elements, a plurality of library design circuit elements adapted to store a uniquely defined set of input and output signals to enable a logic BIST, and a plurality of latches adapted to store a plurality of values corresponding to a behavioral profile of a test clock.

Abstract: A clock selection circuit selectively passes one or more clocks into portions of an integrated circuit for testing. In one mode, the selection circuit passes a functional clock into a section of logic for an at speed test under test program control. In another mode, the selection circuit passes a clock other than the functional clock, such at a reduced frequency, in a test mode.

Abstract: When testing an ASIC using functional clocks, a control circuit at the clock root incorporates additional test logic in the root and a deskewer for clock control, giving rise to a very flexible control that can pass clock signals at a number of clock rates and can pass only a single clock edge, thereby permitting the passage of the required number of clock pulses for a test. The system uses the functional clock and the clock distribution tree designed into the ASIC.

Abstract: A method and circuits for testing an integrated circuit at functional lock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.

Abstract: A scanner using a small, inexpensive CCD array for accurately and easily re-creating an error free reproduction of any scanned image wherein a plurality of laser alignment marks are temporarily projected, from an inexpensive solid state laser via a low cost plastic fiber optic cable, onto the surface of the document, and capturing the image as a number of small segments, along both the horizontal and vertical dimensions of the document onto the surface of the image being scanned. These temporary, projected, alignment marks permit the accurate positioning of adjacent, scanned segments during reconstruction of the scanned document. This scanner can scan documents of any width with an accuracy such that the scanned document can be readily, easily and accurately reassembled regardless of the insensitivity of, or misalignment of the scanning array in the apparatus or the skew of the document relative to the camera doing the scanning.