Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A method and apparatus are provided for implementing communications in a communications network. The apparatus for implementing communications includes a system interface to the communications network. A scheduler schedules enqueued cells and enqueued frames to be transmitted. A segmenter segments frames and cells in into cells or frames applied to a media adaptation block for transmission in a selected one of multiple modes.

Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A method and Gigabit Ethernet communications adapter are provided for implementing communications in a communications network. A transmission queue is defined of data to be transmitted. A transmission rate is set for the transmission queue. Data to be transmitted are enqueued on the transmission queue. The transmission queue can be subdivided into multiple priority queues, for example, using time wheels, and a transmission rate is set for each transmission queue.

Abstract: A memory controller circuit arrangement and method utilize a tuning circuit that dynamically controls the timing of memory control operations, rather than simply relying on fixed timing parameters that are either hardwired or initialized upon startup of a memory controller. Dynamic control over the timing of memory control operations typically incorporates memory test control logic that verifies whether or not a memory storage device will reliably operate using the dynamically-selected values of given timing parameters. Then, based upon the results of such testing, such dynamically-selected values are selectively updated and retested until optimum values are found. The dynamically-selected values may be used to set one or more programmable registers, each of which may in turn be used to control the operation of a programmable delay counter that enables a state transition in a state machine logic circuit to initiate performance of a memory control operation by the logic circuit.

Abstract: A method and apparatus are provided for implementing direct memory access (DMA) with dataflow blocking for users for processing data communications in a communications system. A DMA starting address register receives an initial DMA starting address and a DMA length register receives an initial DMA length. A DMA state machine receives a control input for starting the DMA. The DMA state machine updates the DMA starting address to provide a current DMA starting address. The DMA state machine loads a DMA ending address. A DMA blocking logic receives the current DMA starting address and the DMA ending address and blocks received memory requests only within a current active DMA region.

Abstract: A memory controller circuit arrangement and method utilize a tuning circuit that controls the timing of memory control operations via one or more programmable delay counters. Each counter is programmed to cycle a selected number of clock cycles to delay performance of a memory control operation to meet a predetermined timing parameter for a memory storage device coupled to the controller. Through the use of programmable delay counters, a variety of memory storage devices having varying timing parameters may be supported by the same memory controller design. Moreover, the use of programmable delay counters permit a single path of execution in a memory controller state machine to support any number of timing parameter variations for a particular timing characteristic, as well as multiple timing characteristics.

Abstract: A memory controller circuit arrangement and method utilize a tuning circuit that dynamically controls the timing of memory control operations, rather than simply relying on fixed timing parameters that are either hardwired or initialized upon startup of a memory controller. Dynamic control over the timing of memory control operations typically incorporates memory test control logic that verifies whether or not a memory storage device will reliably operate using the dynamically-selected values of given timing parameters. Then, based upon the results of such testing, such dynamically-selected values are selectively updated and retested until optimum values are found. The dynamically-selected values may be used to set one or more programmable registers, each of which may in turn be used to control the operation of a programmable delay counter that enables a state transition in a state machine logic circuit to initiate performance of a memory control operation by the logic circuit.

Abstract: A memory controller circuit arrangement and method utilize a tuning circuit that dynamically controls the timing of memory control operations, rather than simply relying on fixed timing parameters that are either hardwired or initialized upon startup of a memory controller. Dynamic control over the timing of memory control operations typically incorporates memory test control logic that verifies whether or not a memory storage device will reliably operate using the dynamically-selected values of given timing parameters. Then, based upon the results of such testing, such dynamically-selected values are selectively updated and retested until optimum values are found. The dynamically-selected values may be used to set one or more programmable registers, each of which may in turn be used to control the operation of a programmable delay counter that enables a state transition in a state machine logic circuit to initiate performance of a memory control operation by the logic circuit.

Abstract: A method and apparatus are provided for target addressing and translation in a non-uniform memory environment with user defined target tags. The apparatus for target addressing and translation includes a processor and a first address translation unit coupled to the processor. The first address translation unit translates an effective address (EA) to a real address (RA). The first address translation unit includes a target tag associated with each address translation. A second address translation unit translates a real address (RA) to a target address (TA). The second address translation unit includes a target tag associated with each address translation. A cache includes a cache directory and a target tag is stored into the cache directory with each cache fill.