Abstract: A high resolution circuit and method for facilitating precise measurement of on-chip delays for FPGAs for reliability studies. The circuit embeds a pulse generator on an FPGA chip having one or more groups of LUTS (the “LUT delay chain”), also on-chip. The circuit also embeds a pulse width measurement circuit on-chip, and measures the duration of the generated pulse through the delay chain. The pulse width of the output pulse represents the delay through the delay chain without any I/O delay. The pulse width measurement circuit uses an additional asynchronous clock autonomous from the main clock and the FPGA propagation delay can be displayed on a hex display continuously for testing purposes.

Abstract: The present invention discloses an mixed signal RF drive electronics board that offers small, low power, reliable, and customizable method for driving and generating mass spectra from a mass spectrometer, and for control of other functions such as electron ionizer, ion focusing, single-ion detection, multi-channel data accumulation and, if desired, front-end interfaces such as pumps, valves, heaters, and columns.

Abstract: A microprocessor integrator circuit includes split nanocode memories which enables simultaneous execution of an arithmetic operation and an operand fetch for maximizing through-put. The circuit also includes a shared sequencing arithmetic logic unit which handles all microcode sequencing plus memory address sequencing. The circuit also provides nanocode sequencing which enables storage of constants and data in a microcode space which can include an off-chip writable control store. In addition, two level microcode is utilized to enable long routines to be vertically encoded without the overhead of a large number of read only memory outputs.

Abstract: In a microcircuit employing LSSD boundary scanning, input and output cells of the circuit are tested using the LSSD boundary scan circuity. Input cells of the circuit are tested by applying two voltages alternately to input cell signal pads and capturing and shifting out through input boundary scan circuitry the responses of the input cells to the voltages. Output cells are tested by shifting a predetermined test pattern through the output boundary scan circuitry. The pattern encloses a set of significant bits which is applied sequentially to the output cells. Each output cell has a gated signal path connecting its signal pad to an internal signal conductor which conducts the response of the output cell to an internal signal path as the significant bits of the bit pattern are scanned past the cell.

Abstract: In a microprocessor having independent address and data paths and other pipeline architecture features, a control unit utilizes a PLA which stores microcoded instruction sequences. These sequences permit an operator at a console to read data from and write data to all the internal registers, any external memory location or the program counter. In addition, the PLA contains microcode which enables programs in external memory to be loaded from any location in memory and run by command from the console as well as to enable the operator to halt user program execution, read the pertinent internal registers, and then continue program execution such that single step execution for debug purposes is possible.