Abstract: An x-ray imaging device includes an anti-scatter grid placed inside the housing of the imaging device and adjacent to an x-ray detector.

Abstract: An apparatus and method comprising a cathode structure which can be a cylindrical filament coiled in a helix or which can be constructed of a ribbon or other suitable shape. The cathode structure can be heated by passage of an electrical current, or by other means such as bombardment with energetic electrons. Selected portions of the surface of the cathode structure have an altered property with respect to the non-selected portions of the surface. In one embodiment, the altered property is a curvature. In another embodiment, the altered property is a work function. By altering the property of the selected portions of the surface, the electron beam intensity is increased, and the width is decreased.

Abstract: Methods and systems for scanning objects comprising scanning a portion of an object by a first radiation beam having a first value of a beam characteristic, such as the dose, and detecting the first radiation beam after interaction with the object by a first detector. It is determined whether to change the first value to a second value based, at least in part, on the detected first radiation beam. That portion of the object is then scanned by a second radiation beam having the first value or the second value based on the determination. The second radiation is detected after interacting with the object by a second detector. The second detector may have a second resolution greater than a first resolution of the first detector. The first and second radiation beams may be formed by first and second slots angled with respect to each other.

Abstract: Methods and systems for scanning objects comprising scanning a portion of an object by a first radiation beam having a first value of a beam characteristic, such as the dose, and detecting the first radiation beam after interaction with the object by a first detector. It is determined whether to change the first value to a second value based, at least in part, on the detected first radiation beam. That portion of the object is then scanned by a second radiation beam having the first value or the second value based on the determination. The second radiation is detected after interacting with the object by a second detector. The second detector may have a second resolution greater than a first resolution of the first detector. The first and second radiation beams may be formed by first and second slots angled with respect to each other.

Abstract: An x-ray imaging device includes an anti-scatter grid placed inside the housing of the imaging device and adjacent to an x-ray detector.

Abstract: The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.

Abstract: A radiation detector includes a conversion element that converts an incoming radiation beam into electrical signals, which in turn can be used to generate data about the radiation beam. The conversion element may include, for example, a scintillator that converts the radiation beam into light, and a sensor that generates the signals in response to the light. The conversion element can be used in different schemes or data collection modes. For instance, the conversion element can be oriented normal to the radiation beam or transverse to the radiation beam. In either of these orientations, for example, the detector can be used in an integrating mode or in a counting mode.

Abstract: A radiation detector includes a conversion element that converts an incoming radiation beam into electrical signals, which in turn can be used to generate data about the radiation beam. The conversion element may include, for example, a scintillator that converts the radiation beam into light, and a sensor that generates the signals in response to the light. The conversion element can be used in different schemes or data collection modes. For instance, the conversion element can be oriented normal to the radiation beam or transverse to the radiation beam. In either of these orientations, for example, the detector can be used in an integrating mode or in a counting mode.

Abstract: A radiation detector includes a conversion element that converts an incoming radiation beam into electrical signals, which in turn can be used to generate data about the radiation beam. The conversion element may include, for example, a scintillator that converts the radiation beam into light, and a sensor that generates the signals in response to the light. The conversion element can be used in different schemes or data collection modes. For instance, the conversion element can be oriented normal to the radiation beam or transverse to the radiation beam. In either of these orientations, for example, the detector can be used in an integrating mode or in a counting mode.

Abstract: A radiation system employs magnetic field to move particle beams and radiation sources. The radiation system includes a source operable to produce a particle beam, a scanning magnet operable to scan the particle beam, and a target configured to be impinged by at least a portion of the scanned particle beam to produce radiation.

Abstract: A system for generating image data includes a voltage supply configured for applying a first voltage to generate radiation at a first energy level, and for applying a second voltage to generate radiation at a second energy level, an imager for generating a first set of image data based at least in part on the radiation at the first energy level, and for generating a second set of image data based at least in part on the radiation at the second energy level, and a processor for creating composite image data using the first and the second sets of image data.

Abstract: An apparatus and method comprising a cathode structure which can be a cylindrical filament coiled in a helix or which can be constructed of a ribbon or other suitable shape. The cathode structure can be heated by passage of an electrical current, or by other means such as bombardment with energetic electrons. Selected portions of the surface of the cathode structure have an altered property with respect to the non-selected portions of the surface. In one embodiment, the altered property is a curvature. In another embodiment, the altered property is a work function. By altering the property of the selected portions of the surface, the electron beam intensity is increased, and the width is decreased.

Abstract: Disclosed are systems, methods, and computer program products that generate estimates of errors caused by extraneous radiation in tomographic systems, such as cone-beam computerized tomography (CBCT) systems, fluoroscopic tomography systems, radiographic tomography systems, laminar tomography imaging systems, and the like. In one group of inventions, spatial errors are estimated from projection data collected where a known spatial perturbation has been introduced into radiation intensity of the source. In another group of inventions, temporal errors are estimated from a sequence of projections where a known perturbation in the radiation intensity of the source for different projections has been introduced.

Abstract: An apparatus and method comprising a cathode structure which can be a cylindrical filament coiled in a helix or which can be constructed of a ribbon or other suitable shape. The cathode structure can be heated by passage of an electrical current, or by other means such as bombardment with energetic electrons. Selected portions of the surface of the cathode structure have an altered property with respect to the non-selected portions of the surface. In one embodiment, the altered property is a curvature. In another embodiment, the altered property is a work function. By altering the property of the selected portions of the surface, the electron beam intensity is increased, and the width is decreased.

Abstract: An x-ray system includes an x-ray tube having an anode and a cathode, a sensor configured to sense a condition that results from an operation of the x-ray tube, and a communication device for transmitting a signal to a panel based at least in part on the sensed condition, the panel configured to receive radiation and generate image signals in response to the received radiation. An imaging method includes sensing a condition that results from an operation of an x-ray tube, and transmitting a signal to a panel in response to the sensed condition, wherein the panel is configured to generate image signals in response to radiation, and includes a plurality of image elements.

Abstract: A radiation detector includes a conversion element that converts an incoming radiation beam into electrical signals, which in turn can be used to generate data about the radiation beam. The conversion element may include, for example, a scintillator that converts the radiation beam into light, and a sensor that generates the signals in response to the light. The conversion element can be used in different schemes or data collection modes. For instance, the conversion element can be oriented normal to the radiation beam or transverse to the radiation beam. In either of these orientations, for example, the detector can be used in an integrating mode or in a counting mode.

Abstract: The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.

Abstract: A radiation apparatus includes a radiation source movable in translational and/or rotational degrees of freedom, and a structure adapted to support a body. The structure is provided with an opening to allow a portion of the body passing through to be exposed to at least a portion of the therapeutic radiation while in use.

Abstract: A method of generating images of a portion of a body includes introducing a contrast agent into the body, generating a first set of image data using radiation at a first energy level after the contrast agent is introduced into the body, generating a second set of image data using radiation at a second energy level after the contrast agent is introduced into the body, and creating a volumetric composite image using the first and the second sets of image data.

Abstract: An apparatus and method comprising a cathode structure which can be a cylindrical filament coiled in a helix or which can be constructed of a ribbon or other suitable shape. The cathode structure can be heated by passage of an electrical current, or by other means such as bombardment with energetic electrons. Selected portions of the surface of the cathode structure have an altered property with respect to the non-selected portions of the surface. In one embodiment, the altered property is a curvature. In another embodiment, the altered property is a work function. By altering the property of the selected portions of the surface, the electron beam intensity is increased, and the width is decreased.