Patents by Inventor Gavin Neil Fisher
Gavin Neil Fisher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11821912Abstract: Methods of producing augmented probe system images and associated probe systems. A method of producing an augmented probe system image includes recording a base probe system image, generating the augmented probe system image at least partially based on the base probe system image, and presenting the augmented probe system image. The augmented probe system image includes a representation of at least a portion of the probe system that is obscured in the base probe system image. In some examples, a probe system includes a chuck, a probe assembly, an imaging device, and a controller programmed to perform methods disclosed herein.Type: GrantFiled: May 6, 2021Date of Patent: November 21, 2023Assignee: FormFactor, Inc.Inventors: Anthony James Lord, Gavin Neil Fisher, David Randle Hess
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Patent number: 11454799Abstract: Microscopes with objective assembly crash detection and methods of utilizing the same are disclosed herein. For example, a microscope comprises a microscope body, an objective assembly comprising an objective lens, an objective assembly mount configured to separably attach the objective assembly to the microscope body, and an orientation detection circuit configured to indicate when a relative orientation between the microscope body and the objective assembly differs from a predetermined relative orientation.Type: GrantFiled: January 24, 2020Date of Patent: September 27, 2022Assignee: FormFactor, Inc.Inventors: Gerald Lee Gisler, Sia Choon Beng, Anthony James Lord, Gavin Neil Fisher
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Publication number: 20210373073Abstract: Methods of producing augmented probe system images and associated probe systems. A method of producing an augmented probe system image includes recording a base probe system image, generating the augmented probe system image at least partially based on the base probe system image, and presenting the augmented probe system image. The augmented probe system image includes a representation of at least a portion of the probe system that is obscured in the base probe system image. In some examples, a probe system includes a chuck, a probe assembly, an imaging device, and a controller programmed to perform methods disclosed herein.Type: ApplicationFiled: May 6, 2021Publication date: December 2, 2021Inventors: Anthony James Lord, Gavin Neil Fisher, David Randle Hess
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Patent number: 11047879Abstract: Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact locations, providing a test signal to an electrical structure, and receiving a resultant signal from the electrical structure. The methods further include characterizing at least one of a probe system and the electrical structure based upon the distance. In one embodiment, the probe systems include a measurement device configured to directly measure a distance between a first manipulated assembly and a second manipulated assembly. In another embodiment, the probe systems include a probe head assembly including a platen, a manipulator operatively attached to the platen, a vector network analyzer (VNA) extender operatively attached to the manipulator, and a probe operatively attached to the VNA extender.Type: GrantFiled: October 11, 2019Date of Patent: June 29, 2021Assignee: FormFactor, Inc.Inventors: Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth
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Publication number: 20200241278Abstract: Microscopes with objective assembly crash detection and methods of utilizing the same are disclosed herein. For example, a microscope comprises a microscope body, an objective assembly comprising an objective lens, an objective assembly mount configured to separably attach the objective assembly to the microscope body, and an orientation detection circuit configured to indicate when a relative orientation between the microscope body and the objective assembly differs from a predetermined relative orientation.Type: ApplicationFiled: January 24, 2020Publication date: July 30, 2020Inventors: Gerald Lee Gisler, Sia Choon Beng, Anthony James Lord, Gavin Neil Fisher
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Patent number: 10698002Abstract: Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a support surface configured to support a device under test. The probe systems further include a lower enclosure extending from the lower surface of the platen and an upper enclosure extending from the upper surface of the platen. The upper enclosure includes a side wall that defines a side wall aperture, and the side wall and the platen define an intersection angle of at least 30 degrees and at most 60 degrees. The probe systems also include a manipulator, a probe shaft arm, a probe assembly, a test head, and an electrical conductor.Type: GrantFiled: September 27, 2018Date of Patent: June 30, 2020Assignee: FormFactor Beaverton, Inc.Inventors: Christopher Storm, Michael E. Simmons, Bryan Conrad Bolt, Gavin Neil Fisher, Anthony Lord, Kazuki Negishi
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Publication number: 20200041544Abstract: Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact locations, providing a test signal to an electrical structure, and receiving a resultant signal from the electrical structure. The methods further include characterizing at least one of a probe system and the electrical structure based upon the distance. In one embodiment, the probe systems include a measurement device configured to directly measure a distance between a first manipulated assembly and a second manipulated assembly. In another embodiment, the probe systems include a probe head assembly including a platen, a manipulator operatively attached to the platen, a vector network analyzer (VNA) extender operatively attached to the manipulator, and a probe operatively attached to the VNA extender.Type: ApplicationFiled: October 11, 2019Publication date: February 6, 2020Inventors: Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth
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Patent number: 10459006Abstract: Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact locations, providing a test signal to an electrical structure, and receiving a resultant signal from the electrical structure. The methods further include characterizing at least one of a probe system and the electrical structure based upon the distance. In one embodiment, the probe systems include a measurement device configured to directly measure a distance between a first manipulated assembly and a second manipulated assembly. In another embodiment, the probe systems include a probe head assembly including a platen, a manipulator operatively attached to the platen, a vector network analyzer (VNA) extender operatively attached to the manipulator, and a probe operatively attached to the VNA extender.Type: GrantFiled: September 19, 2017Date of Patent: October 29, 2019Assignee: FormFactor Beaverton, Inc.Inventors: Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth
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Publication number: 20190101567Abstract: Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a support surface configured to support a device under test. The probe systems further include a lower enclosure extending from the lower surface of the platen and an upper enclosure extending from the upper surface of the platen. The upper enclosure includes a side wall that defines a side wall aperture, and the side wall and the platen define an intersection angle of at least 30 degrees and at most 60 degrees. The probe systems also include a manipulator, a probe shaft arm, a probe assembly, a test head, and an electrical conductor.Type: ApplicationFiled: September 27, 2018Publication date: April 4, 2019Inventors: Christopher Storm, Michael E. Simmons, Bryan Conrad Bolt, Gavin Neil Fisher, Anthony Lord, Kazuki Negishi
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Publication number: 20180088149Abstract: Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact locations, providing a test signal to an electrical structure, and receiving a resultant signal from the electrical structure. The methods further include characterizing at least one of a probe system and the electrical structure based upon the distance. In one embodiment, the probe systems include a measurement device configured to directly measure a distance between a first manipulated assembly and a second manipulated assembly. In another embodiment, the probe systems include a probe head assembly including a platen, a manipulator operatively attached to the platen, a vector network analyzer (VNA) extender operatively attached to the manipulator, and a probe operatively attached to the VNA extender.Type: ApplicationFiled: September 19, 2017Publication date: March 29, 2018Inventors: Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth