Patents by Inventor Gelareh BABAIE

Gelareh BABAIE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Noise reduction techniques, fractional bi-spectrum and fractional cross-correlation, and applications
    Patent number: 10203195
    Abstract: A measurement method and system include illuminating an object to be measured with light at two different wavelengths and an incident angle; capturing an image of the object; detecting a frequency of an interference pattern from the image using Fractional Bi-Spectrum Analysis; and calculating a thickness of the object based on the Fractional Bi-Spectrum Analysis. The thickness is calculated based on a relationship between the thickness and the frequency of the interference pattern. The Fractional Bi-Spectrum Analysis is performed on a linear medium with the two different wavelengths being known.
    Type: Grant
    Filed: September 13, 2017
    Date of Patent: February 12, 2019
    Assignee: UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE
    Inventors: Faramarz Farahi, Gelareh Babaie, Mehrdad Abolbashari
  • NOISE REDUCTION TECHNIQUES, FRACTIONAL BI-SPECTRUM AND FRACTIONAL CROSS-CORRELATION, AND APPLICATIONS
    Publication number: 20180128591
    Abstract: A measurement method and system include illuminating an object to be measured with light at two different wavelengths and an incident angle; capturing an image of the object; detecting a frequency of an interference pattern from the image using Fractional Bi-Spectrum Analysis; and calculating a thickness of the object based on the Fractional Bi-Spectrum Analysis. The thickness is calculated based on a relationship between the thickness and the frequency of the interference pattern. The Fractional Bi-Spectrum Analysis is performed on a linear medium with the two different wavelengths being known.
    Type: Application
    Filed: September 13, 2017
    Publication date: May 10, 2018
    Applicant: UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE
    Inventors: Faramarz FARAHI, Gelareh BABAIE, Mehrdad ABOLBASHARI
  • Profilometry systems and methods based on absorption and optical frequency conversion
    Patent number: 9250186
    Abstract: Novel measurement techniques based on moiré techniques and optical frequency conversion. For example, in the IR realm, the configuration can be any moiré configuration, the detector is an IR detector, and the light source can be at any wavelength. The optical configuration, the detector, and the type of light source depend on the physical properties of object/scene and the parameter(s) to be measured.
    Type: Grant
    Filed: March 18, 2014
    Date of Patent: February 2, 2016
    Assignee: The University of North Carolina at Charlotte
    Inventors: Faramarz Farahi, Mehrdad Abolbashari, Gelareh Babaie
  • NOISE REDUCTION TECHNIQUES, FRACTIONAL BI-SPECTRUM AND FRACTIONAL CROSS-CORRELATION, AND APPLICATIONS
    Publication number: 20150022658
    Abstract: A measurement method and system include illuminating an object to be measured with light at two different wavelengths and an incident angle; capturing an image of the object; detecting a frequency of an interference pattern from the image using Fractional Bi-Spectrum Analysis; and calculating a thickness of the object based on the Fractional Bi-Spectrum Analysis. The thickness is calculated based on a relationship between the thickness and the frequency of the interference pattern. The Fractional Bi-Spectrum Analysis is performed on a linear medium with the two different wavelengths being known.
    Type: Application
    Filed: July 16, 2014
    Publication date: January 22, 2015
    Applicant: UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE
    Inventors: Faramarz FARAHI, Gelareh BABAIE, Mehrdad ABOLBASHARI
  • PROFILOMETRY SYSTEMS AND METHODS BASED ON ABSORPTION AND OPTICAL FREQUENCY CONVERSION
    Publication number: 20140374603
    Abstract: The present disclosure provides novel measurement techniques based on moiré techniques and optical frequency conversion. For example, in the IR realm, the configuration can be any moiré configuration, the detector is an IR detector, and the light source can be at any wavelength. The optical configuration, the detector, and the type of light source depend on the physical properties of object/scene and the parameter(s) to be measured.
    Type: Application
    Filed: March 18, 2014
    Publication date: December 25, 2014
    Applicant: THE UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE
    Inventors: Faramarz FARAHI, Mehrdad ABOLBASHARI, Gelareh BABAIE