Patents by Inventor Genki Kinugasa

Genki Kinugasa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230408427
    Abstract: Provided is a sample container which is for use with an X-ray fluorescence analyzer and which permits measurement of light elements in a liquid. The sample container includes a sealable first receptacle, a pressure adjusting valve for adjusting the pressure in the first receptacle, a second receptacle receiving a liquid sample (S) and having both a first opening and a second opening located inside and outside, respectively, of the first receptacle, and an analytical film closing off the second opening and transmitting X-rays.
    Type: Application
    Filed: June 19, 2023
    Publication date: December 21, 2023
    Applicant: JEOL Ltd.
    Inventors: Genki Kinugasa, Kotaro Asami
  • Publication number: 20230112252
    Abstract: There is provided a radiation detection apparatus capable of effectively discriminating between noise and X-ray signal. The radiation detection apparatus includes a detector for detecting radiation and producing a detector output signal, a first differential filter having a time constant and operative to differentiate and convert the detector output signal into a first pulsed signal, a second differential filter having a time constant greater than that of the first differential filter and operative to differentiate and convert the detector output signal into a second pulsed signal, and a noise detection section for detecting noise based on the difference in timing between peaks of the first and second pulsed signals.
    Type: Application
    Filed: October 12, 2022
    Publication date: April 13, 2023
    Inventors: Genki Kinugasa, Kouji Miyatake, Kota Yanagihara, Ryuichi Isobe
  • Patent number: 11549896
    Abstract: An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.
    Type: Grant
    Filed: July 14, 2020
    Date of Patent: January 10, 2023
    Assignee: JEOL Ltd.
    Inventor: Genki Kinugasa
  • Patent number: 11499927
    Abstract: An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen based on the first X-ray spectrum and the second X-ray spectrum.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: November 15, 2022
    Assignee: JEOL Ltd.
    Inventor: Genki Kinugasa
  • Publication number: 20210302336
    Abstract: An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen based on the first X-ray spectrum and the second X-ray spectrum.
    Type: Application
    Filed: March 24, 2021
    Publication date: September 30, 2021
    Inventor: Genki Kinugasa
  • Publication number: 20210018453
    Abstract: An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.
    Type: Application
    Filed: July 14, 2020
    Publication date: January 21, 2021
    Inventor: Genki Kinugasa
  • Publication number: 20210003520
    Abstract: An opening is formed on a horizontal plate. A center of the opening coincides with a center of an X-ray passage area. A line-shaped member for calibration is provided passing the center of the opening. When an X-ray is irradiated onto a sample, an X-ray fluorescence from the sample and an X-ray fluorescence from the line-shaped member are detected at an X-ray detector. An X-ray spectrum produced by this detection includes a reference peak corresponding to the X-ray fluorescence from the line-shaped member, and energy calibration or the like is executed based on the reference peak.
    Type: Application
    Filed: July 1, 2020
    Publication date: January 7, 2021
    Inventor: Genki Kinugasa
  • Patent number: 9268036
    Abstract: A radiation detector is offered which can suppress generation of sum peaks.
    Type: Grant
    Filed: September 24, 2014
    Date of Patent: February 23, 2016
    Assignee: JEOL Ltd.
    Inventor: Genki Kinugasa
  • Patent number: 9188552
    Abstract: An X-ray spectrometer (100) capable of reducing the effects of noises includes: an X-ray detector (110) outputting a staircase waveform (S110); a first differential filter (120) converting the staircase waveform (S110) into a first pulsed signal (S120); an event detection portion (140) detecting whether the first pulsed signal (S120) has exceeded a threshold value; a noise event detection portion (150) determining whether the first pulsed signal (S120) in excess of the threshold value is shorter than a given time; a second differential filter (160) converting the staircase waveform (S110) into a second pulsed signal (S160) having peaks whose heights correspond to the heights of the steps of the staircase waveform; a maximum value detection portion (170) detecting pulsed signal (S160) if the first pulsed signal (S120) exceeds a threshold value; and a decision portion (180) making a decision based on the noise event detection portion (150).
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: November 17, 2015
    Assignee: JEOL Ltd.
    Inventor: Genki Kinugasa
  • Publication number: 20150276630
    Abstract: An X-ray spectrometer (100) capable of reducing the effects of noises includes: an X-ray detector (110) outputting a staircase waveform (S110); a first differential filter (120) converting the staircase waveform (S110) into a first pulsed signal (S120); an event detection portion (140) detecting whether the first pulsed signal (S120) has exceeded a threshold value; a noise event detection portion (150) determining whether the first pulsed signal (S120) in excess of the threshold value is shorter than a given time; a second differential filter (160) converting the staircase waveform (S110) into a second pulsed signal (S160) having peaks whose heights correspond to the heights of the steps of the staircase waveform; a maximum value detection portion (170) detecting pulsed signal (S160) if the first pulsed signal (S120) exceeds a threshold value; and a decision portion (180) making a decision based on the noise event detection portion (150).
    Type: Application
    Filed: March 26, 2014
    Publication date: October 1, 2015
    Applicant: JEOL LTD.
    Inventor: Genki Kinugasa
  • Publication number: 20150083913
    Abstract: A radiation detector is offered which can suppress generation of sum peaks.
    Type: Application
    Filed: September 24, 2014
    Publication date: March 26, 2015
    Inventor: Genki Kinugasa