Patents by Inventor George E. Seidenschnur

George E. Seidenschnur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6411677
    Abstract: The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained.
    Type: Grant
    Filed: September 10, 2001
    Date of Patent: June 25, 2002
    Assignee: General Electric Company
    Inventors: Thomas L. Toth, George E. Seidenschnur, Neil B. Bromberg
  • Publication number: 20020021785
    Abstract: The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained.
    Type: Application
    Filed: September 10, 2001
    Publication date: February 21, 2002
    Inventors: Thomas L. Toth, George E. Seidenschnur, Neil B. Bromberg
  • Patent number: 6310938
    Abstract: The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained.
    Type: Grant
    Filed: August 27, 1999
    Date of Patent: October 30, 2001
    Assignee: General Electric Company
    Inventors: Thomas L. Toth, George E. Seidenschnur, Neil B. Bromberg
  • Patent number: 6246743
    Abstract: The present invention, in one form, is an imaging system which, in one embodiment, alters the configuration of a detector array and a data acquisition system to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: June 12, 2001
    Assignee: General Electric Company
    Inventors: Rudolph T. Kopp, III, Hui David He, George E. Seidenschnur, Paul C. Schanen
  • Patent number: 6198791
    Abstract: The present invention is, in one aspect, an imaging system having a detector that has multiple detector cells extending along a z-axis, the detector being configured to collect multiple slices of data; and a scalable data acquisition system configured to convert signals from the detector to digital form, the scalable data acquisition system having a plurality of converter boards each with a plurality of channels, the channels and detector cells having an interweaved coupling to reduce susceptibility to band artifact.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: March 6, 2001
    Assignee: General Electric Company
    Inventors: Hui David He, Hui Hu, Robert F. Senzig, Gary R. Strong, Guy M. Besson, David M. Hoffman, George E. Seidenschnur, Armin H. Pfoh, Jonathan A. Murray, Thomas L. Toth, Willi W. Hampel
  • Patent number: 5828719
    Abstract: The present invention, in one form, is a system which, in one embodiment, varies DAS gain to better accommodate different scanning parameters between different scans, even at the same slice thickness. Specifically, in one embodiment, the DAS gain is varied, or modulated, as a function of slice thickness, x-ray tube current and voltage levels, scan time, and average detector gain. The DAS gain is modulated using a gain factor Gain.sub.-- Fac which is determined in accordance with each of the above-mentioned scanning parameters. The gain factor Gain.sub.-- Fac is then used to determine an appropriate DAS gain for such parameters. Particularly, DAS gains are stored in a look-up table in the CT system computer, and the gain factor Gain.sub.-- Fac is used to select the appropriate DAS gain from the look-up table. The determined DAS gain is then utilized to correct data acquired during a scan.
    Type: Grant
    Filed: December 23, 1996
    Date of Patent: October 27, 1998
    Assignee: General Electric Company
    Inventors: Hui David He, Gary Richard Strong, Thomas Louis Toth, George E. Seidenschnur