Abstract: A device for measuring the quality of contact between two electrical conductors of an electrical circuit comprises a frame on which are mounted two electrically conductive elements and two electrically conductive pins. The frame is adapted to be inserted onto the electrical conductors, whereupon mechanical actuators displace the elements and pins such that each conductor is contacted by one of the elements and one of the pins to create an electric circuit. The elements are connected to a current generator to cause a current to flow within the circuit. A volt meter is provided to measure the drop in potential between the two pins. Knowledge of the resistance of each conductor enables the drop in potential to be used to measure the quality of the electrical contact between the conductors. The device is particularly useful to determine the quality of contact between conductors whose connections are not readily visible or accessible such as in an electrolysis apparatus in which an anode is immersed in a bath.