Abstract: A nonvolatile memory includes a temperature dependent read window. One or more temperature compensated wordline voltage supply circuits provide temperature compensated wordline signal(s) to the nonvolatile memory. The temperature compensated wordline signals change as the temperature dependent read window changes.

Abstract: There is disclosed example embodiments of flash memory including reference generators using big flash memory cells to generate flash array wordline voltages, wherein the reference voltage values can be trimmed by changing the threshold voltage of the flash cells. In addition, the inventive subject matter provides for using the matching characteristics of two source followers in closed loop and open loop to achieve fast stabilization times. Further, the temperature characteristics of the wordline voltages track the temperature characteristics of the array flash cells. Still further, the disclosed reference generators use cascoding reference generators to provide more reliability and accuracy.

Abstract: According to some embodiments, a process, voltage, and temperature compensated clock generator is disclosed. The clock generator may be a charge-charge clock generator including a first load capacitive element and a second load capacitive element. A process, voltage, and temperature compensated current source is coupled to the charge-charge clock generator, and is used to charge the first load capacitive element and the second load capacitive element.

Abstract: A nonvolatile memory includes a temperature dependent read window. One or more temperature compensated wordline voltage supply circuits provide temperature compensated wordline signal(s) to the nonvolatile memory. The temperature compensated wordline signals change as the temperature dependent read window changes.

Abstract: There is disclosed example embodiments of flash memory including reference generators using big flash memory cells to generate flash array wordline voltages, wherein the reference voltage values can be trimmed by changing the threshold voltage of the flash cells. In addition, the inventive subject matter provides for using the matching characteristics of two source followers in closed loop and open loop to achieve fast stabilization times. Further, the temperature characteristics of the wordline voltages track the temperature characteristics of the array flash cells. Still further, the disclosed reference generators use cascoding reference generators to provide more reliability and accuracy.

Abstract: According to some embodiments, a process, voltage, and temperature compensated clock generator is disclosed. The clock generator may be a charge-charge clock generator including a first load capacitive element and a second load capacitive element. A process, voltage, and temperature compensated current source is coupled to the charge-charge clock generator, and is used to charge the first load capacitive element and the second load capacitive element.

Abstract: An apparatus and method for pre-charging an intermediate node for high-speed wordlines for accessing memory cells in high-speed memory arrays. The apparatus pre-charges a local capacitance located between a wordline supply voltage and the wordline to a voltage level that is greater than the wordline supply voltage. Once the wordline is selected, the charge stored on the local capacitance may be quickly shared with the capacitance of the wordline. The wordline supply voltage may be applied to the local capacitance to provide small, incremental voltage to move the wordline to its final voltage thereby improving the response time of the system.

Abstract: Methods and apparatuses associated with providing a bias voltage for an n-type and a p-type device. A high voltage may be received and used to derive a bias voltage that would reduce a risk of gate-aided breakdown of the drain-to-substrate channel-side pn-junction in an n-type device. The high voltage may be used to derive a bias voltage that would reduce the risk of gate-aided breakdown of the drain-to-substrate channel-side pn-junction in a p-type device.

Abstract: Methods and apparatuses associated with stepping down a high voltage in a high voltage switch. An additional transistor may be coupled to a switching transistor, and the additional transistor biased to a voltage level in between the high voltage to be switched and a switch reference voltage. When the switch is off, the high voltage may thus be spread across multiple devices to prevent a voltage from the gate to the drain to exceed a threshold associated with gate-aided breakdown of the drain-to-substrate channel-side pn-junction.