Patents by Inventor GERD BEHME

GERD BEHME has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and a method for investigating a sample by means of several investigation methods
    Patent number: 9080937
    Abstract: A sample carrier suitable for receiving a sample, a first investigation device for investigating the sample and having a first optical beam path for a first measurement light, a second investigation device for investigating the sample and having a second optical beam path for a second measurement light, wherein the first or the second investigation device comprises a probe microscope suitable for investigating the sample and an optical component having a light-permeable section for the first measurement light and an at least partially reflecting section for the second measurement light and disposed in the first and in the second beam path such that the first optical beam path is formed by a material of the optical component in the light-permeable section and that the second optical beam path is formed with a light-reflecting deflection at the at least one partially reflecting section is provided. An associated method is also provided.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: July 14, 2015
    Assignee: JPK INSTRUMENTS AG
    Inventors: Gerd Behme, Tilo Jankowski, Torsten Jähnke
  • APPARATUS AND A METHOD FOR INVESTIGATING A SAMPLE BY MEANS OF SEVERAL INVESTIGATION METHODS
    Publication number: 20140016119
    Abstract: A sample carrier suitable for receiving a sample, a first investigation device for investigating the sample and having a first optical beam path for a first measurement light, a second investigation device for investigating the sample and having a second optical beam path for a second measurement light, wherein the first or the second investigation device comprises a probe microscope suitable for investigating the sample and an optical component having a light-permeable section for the first measurement light and an at least partially reflecting section for the second measurement light and disposed in the first and in the second beam path such that the first optical beam path is formed by a material of the optical component in the light-permeable section and that the second optical beam path is formed with a light-reflecting deflection at the at least one partially reflecting section is provided. An associated method is also provided.
    Type: Application
    Filed: July 9, 2013
    Publication date: January 16, 2014
    Inventors: GERD BEHME, TILO JANKOWSKI, TORSTEN JÄHNKE