Abstract: A method for correcting a radiation pattern is described by using a system having a device under test with at least one antenna and a measurement antenna. The device under test is located in a placement zone. A radiation pattern of the device under test is measured. A corrected measurement antenna pattern is determined to compensate for an offset of the at least one antenna of the device under test with respect to a coordinate center of the placement zone towards which the measurement antenna is orientated. The corrected measurement antenna pattern is applied on the measured radiation pattern of the device under test to obtain a corrected radiation pattern of the device under test. Furthermore, a system and a computer program for correcting a radiation pattern are described.