Patents by Inventor Gideon Friedmann

Gideon Friedmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for pattern inspection
    Patent number: 7155052
    Abstract: A method for inspecting a patterned surface employs reference data related to the pattern to provide a map for identifying regions which are expected to generate equivalent images. These regions are then compared in an image-to-image comparison to identify possible defects. In a first implementation, the regions are related by local symmetry operators. In a second, disjoint corner features or other features are classified and similar features compared.
    Type: Grant
    Filed: June 10, 2002
    Date of Patent: December 26, 2006
    Assignee: Tokyo Seimitsu (Israel) Ltd
    Inventors: Mark Geshel, Niv Shmueli, Gideon Friedmann, Orna Bregman-Amitai
  • Method for pattern inspection
    Publication number: 20030228050
    Abstract: A method for inspecting a patterned surface employs reference data related to the pattern to provide a map for identifying regions which are expected to generate equivalent images. These regions are then compared in an image-to-image comparison to identify possible defects. In a first implementation, the regions are related by local symmetry operators. In a second, disjoint corner features or other features are classified and similar features compared.
    Type: Application
    Filed: June 10, 2002
    Publication date: December 11, 2003
    Applicant: Tokyo Seimitsu Israel Ltd.
    Inventors: Mark Geshel, Niv Shmueli, Gideon Friedmann, Orna Bregman-Amitai