Patents by Inventor Giljoo Nam

Giljoo Nam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11380056
    Abstract: Disclosed are herein a three-dimensional (3D) object acquisition method and an object acquisition apparatus using artificial light photographs. A 3D object acquisition method according to an embodiment of the present invention includes receiving a plurality of images of a 3D object photographed by a camera, reconstructing spatially-varying bidirectional reflectance distribution functions for the 3D object based on the plurality of images received, estimating shading normals for the 3D object based on the reconstructed spatially-varying bidirectional reflectance distribution functions, and acquiring 3D geometry for the 3D object based on the estimated shading normals.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: July 5, 2022
    Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Min Hyuk Kim, Giljoo Nam
  • Publication number: 20210358211
    Abstract: Disclosed are herein a three-dimensional (3D) object acquisition method and an object acquisition apparatus using artificial light photographs. A 3D object acquisition method according to an embodiment of the present invention includes receiving a plurality of images of a 3D object photographed by a camera, reconstructing spatially-varying bidirectional reflectance distribution functions for the 3D object based on the plurality of images received, estimating shading normals for the 3D object based on the reconstructed spatially-varying bidirectional reflectance distribution functions, and acquiring 3D geometry for the 3D object based on the estimated shading normals.
    Type: Application
    Filed: October 7, 2019
    Publication date: November 18, 2021
    Inventors: Min Hyuk KIM, Giljoo NAM
  • Patent number: 10281396
    Abstract: Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.
    Type: Grant
    Filed: February 8, 2017
    Date of Patent: May 7, 2019
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: MinHyuk Kim, Giljoo Nam, Joo Ho Lee
  • Publication number: 20180087894
    Abstract: Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.
    Type: Application
    Filed: February 8, 2017
    Publication date: March 29, 2018
    Applicant: Korea Advanced Institute of Science and Technology
    Inventors: MinHyuk Kim, Giljoo Nam, Joo Ho Lee