Abstract: A memory includes a supply voltage generation circuit for providing a supply voltage to a plurality of SRAM cells of the memory during at least one mode of memory operation. The supply voltage generation circuit includes a first reference generation circuit that includes at least one SRAM cell with a replica SRAM latch. The first reference generation circuit provides a first voltage during an at least one mode of memory operation. The supply voltage generation circuit includes a second reference generation circuit that includes at least one SRAM cell with a replica SRAM latch. The second reference generation circuit provides a second voltage during the at least one mode of memory operation. The voltage generation circuit includes an output for providing a supply voltage to the plurality of cells during the at least one mode of memory operation.

Abstract: A data processing system includes a memory configured to receive memory access requests. Each memory access request having a corresponding access address and having a corresponding parity bit for an address value of the corresponding access address. The corresponding access address is received over a plurality of address lines and the parity bit is received over a parity line. The memory includes a memory array having a plurality of memory cells arranged in rows, each row having a corresponding word line of a plurality of word lines, and a row decoder coupled to the plurality of address lines, the parity line, and the plurality of word lines. The row decoder is configured to selectively activate a selected word line of the plurality of word lines based on the corresponding access address and the corresponding parity bit of a received memory access request.

Abstract: An integrated circuit (IC) includes a plurality of volatile memory (VM) blocks, and a power gate control circuit configured to control power gating for each VM block of a plurality of VM blocks. The IC includes a power mode controller circuit configured to select a power mode, and in response to selecting a retention mode as the power mode, the power mode controller circuit gates a supply voltage from each block of a selected subset of the plurality of VM blocks and allows a retention voltage to power each VM block of a remaining subset of the plurality of VM blocks outside the selected subset. The IC includes a voltage controller circuit configured to determine a voltage level of the retention voltage based on a minimum retention voltage required for each VM block of the remaining subset.

Abstract: A data processing system includes a memory configured to receive memory access requests. Each memory access request having a corresponding access address and having a corresponding parity bit for an address value of the corresponding access address. The corresponding access address is received over a plurality of address lines and the parity bit is received over a parity line. The memory includes a memory array having a plurality of memory cells arranged in rows, each row having a corresponding word line of a plurality of word lines, and a row decoder coupled to the plurality of address lines, the parity line, and the plurality of word lines. The row decoder is configured to selectively activate a selected word line of the plurality of word lines based on the corresponding access address and the corresponding parity bit of a received memory access request.

Abstract: A plurality of memory cells, in which each memory cell includes two corresponding supply terminal inputs, is powered up while applying a voltage differential between the corresponding supply terminal inputs for each of the plurality of memory cells. After powering up, the plurality of memory cells is read and a physically unclonable function (PUF) response is generated from data of the reading.

Abstract: An integrated circuit (IC) includes a plurality of volatile memory (VM) blocks, and a power gate control circuit configured to control power gating for each VM block of a plurality of VM blocks. The IC includes a power mode controller circuit configured to select a power mode, and in response to selecting a retention mode as the power mode, the power mode controller circuit gates a supply voltage from each block of a selected subset of the plurality of VM blocks and allows a retention voltage to power each VM block of a remaining subset of the plurality of VM blocks outside the selected subset. The IC includes a voltage controller circuit configured to determine a voltage level of the retention voltage based on a minimum retention voltage required for each VM block of the remaining subset.

Abstract: A physically unclonable function (PUF) includes an array of differential PUF bits arranged in rows and columns, wherein each differential bit is located at an intersection of a row and a column, and includes a first PUF cell coupled to a corresponding first bit line and first source line and a second PUF cell coupled to a corresponding second bit line and second source line. The PUF includes a source bias transistor coupled between each corresponding first source line and a first power supply terminal and between each corresponding second source line and the first power supply terminal, wherein a gate electrode of each of the source bias transistors is coupled to a second power supply terminal, and a corresponding set of margin transistors coupled in parallel with each source bias transistor, wherein a gate electrode of each margin transistor is coupled to receive a corresponding margin setting control signal.

Abstract: A physically unclonable function (PUF) includes an array of differential PUF bits arranged in rows and columns, wherein each differential bit is located at an intersection of a row and a column, and includes a first PUF cell coupled to a corresponding first bit line and first source line and a second PUF cell coupled to a corresponding second bit line and second source line. The PUF includes a source bias transistor coupled between each corresponding first source line and a first power supply terminal and between each corresponding second source line and the first power supply terminal, wherein a gate electrode of each of the source bias transistors is coupled to a second power supply terminal, and a corresponding set of margin transistors coupled in parallel with each source bias transistor, wherein a gate electrode of each margin transistor is coupled to receive a corresponding margin setting control signal.

Abstract: A plurality of memory cells, in which each memory cell includes two corresponding supply terminal inputs, is powered up while applying a voltage differential between the corresponding supply terminal inputs for each of the plurality of memory cells. After powering up, the plurality of memory cells is read and a physically unclonable function (PUF) response is generated from data of the reading.