Patents by Inventor Gorden W. Videen

Gorden W. Videen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11353392
    Abstract: A device includes a filter that enhances a beam profile of a received pulsed laser; a first optical element to direct the pulsed laser as a reference wave towards an optical sensor; an open cavity positioned between the first optical element and the optical sensor. The open cavity receives an aerosol particle, which enters the open cavity from any direction. The reference wave illuminates the aerosol particle. An illuminated particle generates and directs an object wave towards the optical sensor. A pixel array is connected to the optical sensor. The pixel array receives the reference wave and the object wave. The optical sensor creates a contrast hologram comprising an interference pattern of the illuminated particle. A processor creates an image of the illuminated particle based on the contrast hologram.
    Type: Grant
    Filed: September 21, 2020
    Date of Patent: June 7, 2022
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Matthew J. Berg, Osku P. Kemppinen, Gorden W. Videen
  • Publication number: 20220091019
    Abstract: A device includes a filter that enhances a beam profile of a received pulsed laser; a first optical element to direct the pulsed laser as a reference wave towards an optical sensor; an open cavity positioned between the first optical element and the optical sensor. The open cavity receives an aerosol particle, which enters the open cavity from any direction. The reference wave illuminates the aerosol particle. An illuminated particle generates and directs an object wave towards the optical sensor. A pixel array is connected to the optical sensor. The pixel array receives the reference wave and the object wave. The optical sensor creates a contrast hologram comprising an interference pattern of the illuminated particle. A processor creates an image of the illuminated particle based on the contrast hologram.
    Type: Application
    Filed: September 21, 2020
    Publication date: March 24, 2022
    Inventors: Matthew J. Berg, Osku P. Kemppinen, Gorden W. Videen
  • Patent number: 9609238
    Abstract: A method and apparatus is provided for modeling a three-dimensional topological surface of an object acquiring, using a thermal imaging camera, a first image of the object, wherein the first image comprises a plurality of pixels each representative of at least one component of thermal data, calculating a normal vector for each pixel in the first image, corresponding to the normal vector on a surface of the object, generating a three-dimensional model representing a surface of the object based on aggregating the normal vector for each pixel together in the first image.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: March 28, 2017
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Gorden W. Videen, Kristan P. Gurton, Alexey J. Yuffa
  • Publication number: 20160232709
    Abstract: A method and apparatus is provided for modeling a three-dimensional topological surface of an object acquiring, using a thermal imaging camera, a first image of the object, wherein the first image comprises a plurality of pixels each representative of at least one component of thermal data, calculating a normal vector for each pixel in the first image, corresponding to the normal vector on a surface of the object, generating a three-dimensional model representing a surface of the object based on aggregating the normal vector for each pixel together in the first image.
    Type: Application
    Filed: February 9, 2015
    Publication date: August 11, 2016
    Inventors: Gorden W. Videen, Kristan P. Gurton, Alexey J. Yuffa
  • Patent number: 7920262
    Abstract: A system for measuring backscattered light from a sample is given. Light is output from a light source towards a rotating mirror, and then reflected by the rotating mirror towards the sample. The sample reflects backscattered light back towards the rotating mirror, which, having moved during the time it took for the light to propagate from the mirror to the sample and back, reflects the backscattered light to a detector located at a physical separation from the light source. The detected backscattered light may be analyzed to determine various properties of the sample.
    Type: Grant
    Filed: September 17, 2008
    Date of Patent: April 5, 2011
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Gorden W. Videen, Karri Olavi Muinonen
  • Publication number: 20100067007
    Abstract: A system for measuring backscattered light from a sample is given. Light is output from a light source towards a rotating mirror, and then reflected by the rotating mirror towards the sample. The sample reflects backscattered light back towards the rotating mirror, which, having moved during the time it took for the light to propagate from the mirror to the sample and back, reflects the backscattered light to a detector located at a physical separation from the light source. The detected backscattered light may be analyzed to determine various properties of the sample.
    Type: Application
    Filed: September 17, 2008
    Publication date: March 18, 2010
    Inventors: GORDEN W. VIDEEN, Karri Olavi Muinonen