Patents by Inventor Goro KAMBE

Goro KAMBE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11662322
    Abstract: An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: May 30, 2023
    Assignee: Shimadzu Corporation
    Inventors: Bunta Matsuhana, Goro Kambe, Futoshi Ueki
  • Patent number: 11599990
    Abstract: A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: March 7, 2023
    Assignee: Shimadzu Corporation
    Inventors: Bunta Matsuhana, Goro Kambe
  • Patent number: 11490498
    Abstract: Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.
    Type: Grant
    Filed: July 1, 2021
    Date of Patent: November 1, 2022
    Assignee: SHIMADZU CORPORATION
    Inventors: Bunta Matsuhana, Goro Kambe
  • Patent number: 11450502
    Abstract: An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.
    Type: Grant
    Filed: December 31, 2020
    Date of Patent: September 20, 2022
    Assignee: SHIMADZU CORPORATION
    Inventors: Bunta Matsuhana, Goro Kambe
  • Publication number: 20220208502
    Abstract: An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.
    Type: Application
    Filed: December 31, 2020
    Publication date: June 30, 2022
    Applicant: Shimadzu Corporation
    Inventors: Bunta MATSUHANA, Goro KAMBE
  • Publication number: 20220207683
    Abstract: A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.
    Type: Application
    Filed: July 29, 2021
    Publication date: June 30, 2022
    Applicant: Shimadzu Corporation
    Inventors: Bunta MATSUHANA, Goro KAMBE
  • Publication number: 20220170868
    Abstract: An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.
    Type: Application
    Filed: July 29, 2021
    Publication date: June 2, 2022
    Applicant: Shimadzu Corporation
    Inventors: Bunta MATSUHANA, Goro KAMBE, Futoshi UEKI
  • Publication number: 20220151050
    Abstract: Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.
    Type: Application
    Filed: July 1, 2021
    Publication date: May 12, 2022
    Applicant: Shimadzu Corporation
    Inventors: Bunta MATSUHANA, Goro KAMBE
  • Patent number: 10820399
    Abstract: An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: October 27, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Bunta Matsuhana, Goro Kambe
  • Publication number: 20190380193
    Abstract: An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.
    Type: Application
    Filed: February 28, 2019
    Publication date: December 12, 2019
    Inventors: Bunta MATSUHANA, Goro KAMBE
  • Patent number: 10473596
    Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, and a stage. A dose rate calculation unit of a control section calculates a dose rate at any position in an inspection space, a stage face information storage unit 32 stores stage face information, an irradiation history monitoring unit monitors a movement locus, a stage face cumulative irradiation dose calculation unit calculates cumulative irradiation dose distribution data, a stage face imaging range calculation unit calculates a stage face imaging range of the X-ray detector, and a dose distribution image display control unit extracts the cumulative irradiation dose distribution data in an imaging range and displays an image thereof.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: November 12, 2019
    Assignee: Shimadzu Corporation
    Inventor: Goro Kambe
  • Publication number: 20180252656
    Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, and a stage. A dose rate calculation unit of a control section calculates a dose rate at any position in an inspection space, a stage face information storage unit 32 stores stage face information, an irradiation history monitoring unit monitors a movement locus, a stage face cumulative irradiation dose calculation unit calculates cumulative irradiation dose distribution data, a stage face imaging range calculation unit calculates a stage face imaging range of the X-ray detector, and a dose distribution image display control unit extracts the cumulative irradiation dose distribution data in an imaging range and displays an image thereof.
    Type: Application
    Filed: February 20, 2018
    Publication date: September 6, 2018
    Applicant: Shimadzu Corporation
    Inventor: Goro KAMBE