Patents by Inventor Goro KAMBE
Goro KAMBE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11662322Abstract: An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.Type: GrantFiled: July 29, 2021Date of Patent: May 30, 2023Assignee: Shimadzu CorporationInventors: Bunta Matsuhana, Goro Kambe, Futoshi Ueki
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Patent number: 11599990Abstract: A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.Type: GrantFiled: July 29, 2021Date of Patent: March 7, 2023Assignee: Shimadzu CorporationInventors: Bunta Matsuhana, Goro Kambe
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Patent number: 11490498Abstract: Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.Type: GrantFiled: July 1, 2021Date of Patent: November 1, 2022Assignee: SHIMADZU CORPORATIONInventors: Bunta Matsuhana, Goro Kambe
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Patent number: 11450502Abstract: An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.Type: GrantFiled: December 31, 2020Date of Patent: September 20, 2022Assignee: SHIMADZU CORPORATIONInventors: Bunta Matsuhana, Goro Kambe
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Publication number: 20220208502Abstract: An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.Type: ApplicationFiled: December 31, 2020Publication date: June 30, 2022Applicant: Shimadzu CorporationInventors: Bunta MATSUHANA, Goro KAMBE
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Publication number: 20220207683Abstract: A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.Type: ApplicationFiled: July 29, 2021Publication date: June 30, 2022Applicant: Shimadzu CorporationInventors: Bunta MATSUHANA, Goro KAMBE
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Publication number: 20220170868Abstract: An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.Type: ApplicationFiled: July 29, 2021Publication date: June 2, 2022Applicant: Shimadzu CorporationInventors: Bunta MATSUHANA, Goro KAMBE, Futoshi UEKI
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Publication number: 20220151050Abstract: Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.Type: ApplicationFiled: July 1, 2021Publication date: May 12, 2022Applicant: Shimadzu CorporationInventors: Bunta MATSUHANA, Goro KAMBE
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Patent number: 10820399Abstract: An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.Type: GrantFiled: February 28, 2019Date of Patent: October 27, 2020Assignee: SHIMADZU CORPORATIONInventors: Bunta Matsuhana, Goro Kambe
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Publication number: 20190380193Abstract: An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.Type: ApplicationFiled: February 28, 2019Publication date: December 12, 2019Inventors: Bunta MATSUHANA, Goro KAMBE
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Patent number: 10473596Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, and a stage. A dose rate calculation unit of a control section calculates a dose rate at any position in an inspection space, a stage face information storage unit 32 stores stage face information, an irradiation history monitoring unit monitors a movement locus, a stage face cumulative irradiation dose calculation unit calculates cumulative irradiation dose distribution data, a stage face imaging range calculation unit calculates a stage face imaging range of the X-ray detector, and a dose distribution image display control unit extracts the cumulative irradiation dose distribution data in an imaging range and displays an image thereof.Type: GrantFiled: February 20, 2018Date of Patent: November 12, 2019Assignee: Shimadzu CorporationInventor: Goro Kambe
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Publication number: 20180252656Abstract: An X-ray inspection apparatus includes an X-ray source, an X-ray detector, and a stage. A dose rate calculation unit of a control section calculates a dose rate at any position in an inspection space, a stage face information storage unit 32 stores stage face information, an irradiation history monitoring unit monitors a movement locus, a stage face cumulative irradiation dose calculation unit calculates cumulative irradiation dose distribution data, a stage face imaging range calculation unit calculates a stage face imaging range of the X-ray detector, and a dose distribution image display control unit extracts the cumulative irradiation dose distribution data in an imaging range and displays an image thereof.Type: ApplicationFiled: February 20, 2018Publication date: September 6, 2018Applicant: Shimadzu CorporationInventor: Goro KAMBE